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Volumn 15, Issue 4, 2000, Pages 1008-1016
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Controlled planar interface synthesis by ultrahigh vacuum diffusion bonding/deposition
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ALLOYING;
AUGER ELECTRON SPECTROSCOPY;
CERAMIC MATERIALS;
CHEMICAL BONDS;
ELECTRON BEAMS;
EVAPORATION;
FRACTURE TESTING;
HEAT TREATMENT;
ION BEAMS;
SEMICONDUCTOR MATERIALS;
SINGLE CRYSTALS;
SPUTTER DEPOSITION;
SURFACE CHEMISTRY;
SYNTHESIS (CHEMICAL);
THERMAL DIFFUSION;
CONTROLLED PLANAR INTERFACES;
ELECTRON BEAM EVAPORATION;
VACUUM DIFFUSION;
INTERFACES (MATERIALS);
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EID: 0034174602
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2000.0144 Document Type: Article |
Times cited : (10)
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References (29)
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