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Applied Physics Letters

Volumn 72, Issue 9, 1998, Pages 1095-1097

Characterization of Si pn junctions fabricated by direct wafer bonding in ultra-high vacuum

(4) Hobart, K D a Twigg, M E a Kub, F J a Desmond, C A b

a NAVAL RESEARCH LABORATORY (United States)

b CALIFORNIA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000394640 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.120975 Document Type: Article

Times cited : (29)

References (15)

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