Quasi-3D device simulation for microwave noise characterization of MOS devices

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1998, Pages 77-80

  Lin, Yi ^a   Wang, Lan ^a   Obrecht, Michael ^a   Manku, Tajinder ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; SPURIOUS SIGNAL NOISE;

MICROWAVE NOISE;

MOSFET DEVICES;

EID: 0032275851     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)