Phonon spectroscopy by inelastic x-ray scattering

Reports on Progress in Physics

Volumn 63, Issue 2, 2000, Pages 171-232

  Burkel, Eberhard ^a  

^a UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT METHOD;

EID: 0033935438     PISSN: 00344885     EISSN: None     Source Type: Journal    
DOI: 10.1088/0034-4885/63/2/203     Document Type: Review

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