High resolution inelastic x-ray scattering spectrometer at the advanced photon source

Review of Scientific Instruments

Volumn 69, Issue 9, 1998, Pages 3109-3112

  Schwoerer Bohning M ^a   MacRander, A T ^a   Abbamonte, P M ^a   Arms, D A ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; DIAMONDS; DIFFERENTIAL EQUATIONS; MIRRORS; MONOCHROMATORS; OPTICAL RESOLVING POWER; PHOTONS; SILICON WAFERS; SYNCHROTRON RADIATION; THERMAL LOAD; X RAY SCATTERING;

ADVANCED PHOTON SOURCE; FOCUSING ANALYZER; INELASTIC SCATTERING;

X RAY SPECTROMETERS;

EID: 0032159679     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149068     Document Type: Article

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