X-ray optics for μeV-resolved spectroscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 394, Issue 1-2, 1997, Pages 251-255

  Rohlsberger R ^a,b,d   Gerdau, E ^b   Ruffer R ^c   Sturhahn, W ^a   Toellner, T S ^a   Chumakov, A I ^c   Alp, E E ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF HAMBURG   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DOPPLER EFFECT; ELECTROMAGNETIC WAVE SCATTERING; MIRRORS; OPTICAL SYSTEMS; SYNCHROTRON RADIATION;

ENERGY RESOLUTION; MICRO EV ENERGY RANGE;

X RAY SPECTROSCOPY;

EID: 0031189718     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)00710-9     Document Type: Article

References (20)

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17. W. Sturhahn, E. Gerdau, Phys. Rev. B 49 (1994) 9285.
18. 2. For this film, dε ≈ 0.7 μeV.
19. R. Röhlsberger et al., to be published.
20. -1 has been measured with the same setup at the undulator beamline 3ID of the Advanced Photon Source, Argonne, USA.