Vibrational density of states of thin films measured by inelastic scattering of synchrotron radiation

Physica B: Condensed Matter

Volumn 263-264, Issue , 1999, Pages 581-583

  Rohlsberger R ^a   Sturhahn, W ^b   Toellner, T S ^b   Quast, K W ^b   Alp, E E ^b   Bernhard, A ^a   Metge, J ^c   Ruffer R ^c   Burkel, E ^a  

^a UNIVERSITY OF ROSTOCK   (Germany)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE SCATTERING; SYNCHROTRON RADIATION; THIN FILMS; WAVEGUIDES; X RAY ANALYSIS;

MOESSBAUER EFFECT;

ELECTRONIC DENSITY OF STATES;

EID: 0345476923     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)01259-9     Document Type: Article

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