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Volumn 3151, Issue , 1997, Pages 282-286

A spherical bent focusing analyzer for high resolution inelastic x-ray scattering

Author keywords

High energy resolution; Inelastic X ray scattering; Synchrotron radiation instrumentation; X ray optics

Indexed keywords

ELECTROMAGNETIC WAVES; GLASS; HEAT FLUX; INSTRUMENTS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SYNCHROTRON RADIATION; SYNCHROTRONS; THERMONUCLEAR REACTIONS; X RAY SCATTERING; X RAYS;

EID: 11544358375     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.294487     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 4
    • 58749091814 scopus 로고    scopus 로고
    • E. Burkel, H. Sinn, and M. Schwoerer-Böhning private comunication ,1994.
    • E. Burkel, H. Sinn, and M. Schwoerer-Böhning private comunication ,1994.
  • 6
    • 85024788939 scopus 로고    scopus 로고
    • A. Macrander, M. Saginuri, S. Yao, P. Hesketh, and C. Bresloff Rev. Sci. Instrum. 67, 9, 1996-CD-ROM.
    • A. Macrander, M. Saginuri, S. Yao, P. Hesketh, and C. Bresloff Rev. Sci. Instrum. 67, 9, 1996-CD-ROM.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.