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Volumn 3151, Issue , 1997, Pages 282-286
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A spherical bent focusing analyzer for high resolution inelastic x-ray scattering
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Author keywords
High energy resolution; Inelastic X ray scattering; Synchrotron radiation instrumentation; X ray optics
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Indexed keywords
ELECTROMAGNETIC WAVES;
GLASS;
HEAT FLUX;
INSTRUMENTS;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
SYNCHROTRON RADIATION;
SYNCHROTRONS;
THERMONUCLEAR REACTIONS;
X RAY SCATTERING;
X RAYS;
BACK REFLECTIONS;
BEAM LINES;
ENERGY RESOLUTIONS;
HIGH ENERGY RESOLUTION;
HIGH RESOLUTIONS;
INELASTIC X-RAY SCATTERING;
PYREX GLASS;
SYNCHROTRON RADIATION INSTRUMENTATION;
X-RAY OPTICS;
SCATTERING;
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EID: 11544358375
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.294487 Document Type: Conference Paper |
Times cited : (5)
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References (9)
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