A system for single‐crystal elastic and inelastic x‐ray scattering studies of condensed gases at pressures to 300 MPa and temperatures to 4 K

Review of Scientific Instruments

Volumn 67, Issue 9, 1996, Pages 3365-

  Venkataraman, C T ^a   Simmons, R O ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

ELASTIC SCATTERING; FLUORINATED ALIPHATIC HYDROCARBONS; HELIUM 4; HIGH PRESSURE; INELASTIC SCATTERING; LATTICE PARAMETERS; MONOCRYSTALS; SAMPLE HOLDERS; SYNCHROTRON RADIATION; TEMPERATURE RANGE 0000 0013 K; X RAY SPECTROMETERS; X RAY SPECTROSCOPY

Indexed keywords

EID: 0000487841     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.1147358     Document Type: Conference Paper

References (0)