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Volumn 12, Issue 1, 2000, Pages 32-34

Lead-free solders in Japan (A personal impression)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT TREATMENT; MATERIALS TESTING; STRESS ANALYSIS; SURFACE MOUNT TECHNOLOGY; THERMAL CYCLING;

EID: 0033904068     PISSN: 09540911     EISSN: None     Source Type: Journal    
DOI: 10.1108/09540910010312410     Document Type: Article
Times cited : (3)

References (19)
  • 1
    • 0028404312 scopus 로고
    • Modelling complex inelastic deformation processes in IC packages solder joints
    • Busso, E.P., Kitano, M. and Kumazawa, T. (1994), "Modelling complex inelastic deformation processes in IC packages solder joints", J. Electronic Packaging, Vol. 116, pp. 6-15.
    • (1994) J. Electronic Packaging , vol.116 , pp. 6-15
    • Busso, E.P.1    Kitano, M.2    Kumazawa, T.3
  • 2
    • 0032207630 scopus 로고    scopus 로고
    • Mechanical fatigue characteristics of Sn-3.5 Ag-x (x = Bi, Cu, Zn and In) solder alloys
    • Kariya, Y. and Otsuka, M. (1998a), "Mechanical fatigue characteristics of Sn-3.5 Ag-x (x = Bi, Cu, Zn and In) solder alloys", J. Electronic Materials,Vol. 27, pp. 1229-35.
    • (1998) J. Electronic Materials , vol.27 , pp. 1229-1235
    • Kariya, Y.1    Otsuka, M.2
  • 3
    • 0000278386 scopus 로고    scopus 로고
    • Effect of bismuth on isothermal fatigue properties of Sn-3.5 mass% Ag solder alloy
    • Kariya, Y. and Otsuka, M. (1998b), "Effect of bismuth on isothermal fatigue properties of Sn-3.5 mass% Ag solder alloy", J. Electronic Materials, Vol. 27, pp. 866-70.
    • (1998) J. Electronic Materials , vol.27 , pp. 866-870
    • Kariya, Y.1    Otsuka, M.2
  • 4
    • 0001653023 scopus 로고    scopus 로고
    • Shape prediction of solder bump joint by surface tension analysis and fatigue strength evaluation
    • Suhir, E., Shiratori. M., Lee, Y.C. and Subbarayan, G. (Eds), ASME, New York, NY
    • Kitano, M. and Honda, M. (1997), "Shape prediction of solder bump joint by surface tension analysis and fatigue strength evaluation", in Suhir, E., Shiratori. M., Lee, Y.C. and Subbarayan, G. (Eds), Advances in Electronic Packaging, ASME, New York, NY, pp. 1407-12.
    • (1997) Advances in Electronic Packaging , pp. 1407-1412
    • Kitano, M.1    Honda, M.2
  • 5
    • 0029229048 scopus 로고
    • Development of structural design aiding system for plastic IC packages by using personal computer
    • Hsu, T.R., Bar-Cohen. A. and Nakayama, W. (Eds), ASME, New York, NY
    • Kitano, M., Nishimura, A., Kumazawa, T., Kawai, S. and Shimizu, I. (1993), "Development of structural design aiding system for plastic IC packages by using personal computer", in Hsu, T.R., Bar-Cohen. A. and Nakayama, W. (Eds), Advances in Electronic Packaging, ASME, New York, NY, pp. 481-8.
    • (1993) Advances in Electronic Packaging , pp. 481-488
    • Kitano, M.1    Nishimura, A.2    Kumazawa, T.3    Kawai, S.4    Shimizu, I.5
  • 8
    • 33746776034 scopus 로고    scopus 로고
    • Life prediction of solders in electronics - Benefiting from previous experience
    • Sydney
    • Plumbridge, W.J. (1997), "Life prediction of solders in electronics - benefiting from previous experience", 9th Int. Conf. on Fracture (ICF9), Sydney, pp. 167-78.
    • (1997) 9th Int. Conf. on Fracture (ICF9) , pp. 167-178
    • Plumbridge, W.J.1
  • 9
    • 85037969537 scopus 로고    scopus 로고
    • The effect of temperature on fatigue-creep interactions in a tin-lead solder
    • San Diego, CA
    • Plumbridge, W.J. and Moffatt, J.E. (1999), "The effect of temperature on fatigue-creep interactions in a tin-lead solder", Interconnect PACK Conf., San Diego, CA.
    • (1999) Interconnect PACK Conf.
    • Plumbridge, W.J.1    Moffatt, J.E.2
  • 12
    • 0029481648 scopus 로고
    • Microstructure and strength of interface between Sn-Ag eutectic solder and Cu
    • Suganuma, K. and Nakamura, Y. (1995), "Microstructure and strength of interface between Sn-Ag eutectic solder and Cu", J. Japan Inst. Metals, Vol. 59, pp. 1299-1305.
    • (1995) J. Japan Inst. Metals , vol.59 , pp. 1299-1305
    • Suganuma, K.1    Nakamura, Y.2
  • 13
    • 0032188151 scopus 로고    scopus 로고
    • Wetting and interface microstructure between Sn-Zn binary alloys and Cu
    • Suganuma, K., Niihara, K., Shoutoku, T. and Nakamura (1997), "Wetting and interface microstructure between Sn-Zn binary alloys and Cu", J. Mater. Res. Vol. 13, pp. 2859-65.
    • (1997) J. Mater. Res. , vol.13 , pp. 2859-2865
    • Suganuma, K.1    Niihara, K.2    Shoutoku, T.3
  • 14
    • 0011921922 scopus 로고
    • Statistical fatigue life estimation: The influence of temperature and composition on low cycle fatigue of tin-lead solders
    • Tanaka, T., Nishijima, S. and Ichikawa, M. (1987), "Statistical fatigue life estimation: the influence of temperature and composition on low cycle fatigue of tin-lead solders", Current Japanese Research, Vol. 2, pp. 235-50.
    • (1987) Current Japanese Research , vol.2 , pp. 235-250
    • Tanaka, T.1    Nishijima, S.2    Ichikawa, M.3
  • 17
    • 85037968057 scopus 로고    scopus 로고
    • A strain rate ratio approach for assessing creep-fatigue life of 63Sn-37Pb solder under shear loading
    • to be published, submitted to trans, ASME
    • Tsukuda, Y., Nishimura, H., Yamamoto, H. and Sakane, M. (to be published), submitted to trans, "A strain rate ratio approach for assessing creep-fatigue life of 63Sn-37Pb solder under shear loading", J. Electr. Packaging, ASME.
    • J. Electr. Packaging
    • Tsukuda, Y.1    Nishimura, H.2    Yamamoto, H.3    Sakane, M.4
  • 19
    • 0022699979 scopus 로고
    • Isothermal fatigue of low tin-lead based solder
    • Vaynman, S., Fine, M.E. and Jeannotte, D.A. (1988), "Isothermal fatigue of low tin-lead based solder", Metall. Trans., Vol. 19A, pp. 1051-7.
    • (1988) Metall. Trans. , vol.19 A , pp. 1051-1057
    • Vaynman, S.1    Fine, M.E.2    Jeannotte, D.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.