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0028404312
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Modelling complex inelastic deformation processes in IC packages solder joints
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Mechanical fatigue characteristics of Sn-3.5 Ag-x (x = Bi, Cu, Zn and In) solder alloys
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Kariya, Y.1
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3
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Effect of bismuth on isothermal fatigue properties of Sn-3.5 mass% Ag solder alloy
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Kariya, Y.1
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4
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0001653023
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Shape prediction of solder bump joint by surface tension analysis and fatigue strength evaluation
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Kitano, M. and Honda, M. (1997), "Shape prediction of solder bump joint by surface tension analysis and fatigue strength evaluation", in Suhir, E., Shiratori. M., Lee, Y.C. and Subbarayan, G. (Eds), Advances in Electronic Packaging, ASME, New York, NY, pp. 1407-12.
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Kitano, M.1
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5
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0029229048
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Development of structural design aiding system for plastic IC packages by using personal computer
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Hsu, T.R., Bar-Cohen. A. and Nakayama, W. (Eds), ASME, New York, NY
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Mechanical fatigue tests of solder bumps
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Properties of Sn-Ag binary alloy as lead-free solder and interface microstructure with Cu
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8
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Life prediction of solders in electronics - Benefiting from previous experience
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Plumbridge, W.J.1
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9
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85037969537
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The effect of temperature on fatigue-creep interactions in a tin-lead solder
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10
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0029452833
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Reflow soldering using selective infra-red radiation
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12
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0029481648
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Microstructure and strength of interface between Sn-Ag eutectic solder and Cu
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Suganuma, K.1
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13
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0032188151
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Wetting and interface microstructure between Sn-Zn binary alloys and Cu
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14
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0011921922
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Statistical fatigue life estimation: The influence of temperature and composition on low cycle fatigue of tin-lead solders
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0027046946
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Reliability and stress analysis of encapsulated flip chip joint on epoxy base printed circuit board
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Milpitas, CA
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Tsukada, T., Mashimoto, Y., Nishio, T. and Nii, M. (1992), "Reliability and stress analysis of encapsulated flip chip joint on epoxy base printed circuit board", Proc. ASME/JSME Joint Conf. for Advances in Electronic Packaging, Milpitas, CA, Vol. 2, pp. 827-35.
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17
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85037968057
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A strain rate ratio approach for assessing creep-fatigue life of 63Sn-37Pb solder under shear loading
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to be published, submitted to trans, ASME
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Tsukuda, Y., Nishimura, H., Yamamoto, H. and Sakane, M. (to be published), submitted to trans, "A strain rate ratio approach for assessing creep-fatigue life of 63Sn-37Pb solder under shear loading", J. Electr. Packaging, ASME.
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Tsukuda, Y.1
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18
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0032311887
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Thermal analysis of printed circuit boards for infra-red reflow soldering
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19
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Isothermal fatigue of low tin-lead based solder
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