Advantages of the in-situ LTP distortion profile test on high-heat-load mirrors and applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2856, Issue , 1996, Pages 172-182

  Qian, Shinan ^a   Jark, Werner ^a   Sostero, Giovanni ^a   Gambitta, Alessandro ^a   Mazzolini, Fabio ^a   Savoia, Adolfo ^a  

^a SINCROTRONE TRIESTE   (Italy)

Author keywords

Distortion; High heat load; High brightness; In situ LTP; LTP; Measurement

Indexed keywords

DISTORTION (WAVES); EQUIPMENT TESTING; LUMINANCE; MEASUREMENT; MIRRORS; PRISMS; SYNCHROTRON RADIATION; SYNCHROTRONS; THERMAL LOAD; WIGGLERS;

ACCURACY AND REPEATABILITIES; HIGH BRIGHTNESS; HIGH HEAT LOAD; MEASURING METHOD; PROFILE MEASUREMENT; TANGENTIAL DIRECTIONS; TEST EQUIPMENTS; VACUUM CHAMBERS;

OPTICAL TESTING;

EID: 0000500655     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.259870     Document Type: Conference Paper

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