Penta-prism LTP detects first in situ distortion profile

Synchrotron Radiation News

Volumn 9, Issue 3, 1996, Pages 42-44

  Qian, Shinan ^a   Jark, Werner ^a   Sostero, Giovanni ^a   Gambitta, Alessandro ^a   Mazzolini, Fabio ^a   Tudor, Massimiliano ^a   Allemandi, Andrea ^a   Abrami, Alessandro ^a   Battistello, Luigino ^a   Sergo, Rudi ^a   Savoia, Adolfo ^a  

^a SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040150910     PISSN: 08940886     EISSN: 19317344     Source Type: Journal    
DOI: 10.1080/08940889608602880     Document Type: Article

References (6)

1. Qian, Shinan. Metrology: Figure and Finish Edited by: Truax, B.
2. 1987. Proc. SPIE, 749: 30
3. Carl Zeiss, Catalogue, “Detect 16 Wavefront Sensor for Laboratory and Shopfloor Use.
4. Qian, Shinan. September 1993. Schematic of In Situ LTP, September, APS.
5. Qian, Shinan. 1995. Optical Engineering, 34(2): 396
6. Qian, Shinan. 1995. Rev. Sci. Instrum., 66(3): 2562