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Volumn 153, Issue 4, 2000, Pages 223-234
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Study of atomic layer epitaxy of zinc oxide by in-situ quartz crystal microgravimetry
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ORIENTATION;
DEPOSITION;
EPITAXIAL GROWTH;
GRAVIMETRIC ANALYSIS;
MONOLAYERS;
QUARTZ APPLICATIONS;
SUBSTRATES;
SURFACE PHENOMENA;
SURFACE ROUGHNESS;
THERMAL EFFECTS;
THIN FILMS;
ATOMIC LAYER EPITAXY (ALE);
QUARTZ CRYSTAL MICROBALANCE;
SURFACE RECONSTRUCTION;
ZINC OXIDE;
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EID: 0033886407
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(99)00330-X Document Type: Article |
Times cited : (181)
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References (15)
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