In situ investigation of the surface chemistry of atomic-layer epitaxial growth of II-VI semiconductor thin films

Langmuir

Volumn 14, Issue 6, 1998, Pages 1493-1499

  Luo, Y ^a   Slater, D ^a   Han, M ^a   Moryl, J ^a   Osgood Jr , R M ^a   Chen, J G ^b  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; EPITAXIAL GROWTH; HYDROGEN SULFIDE; SEMICONDUCTING ZINC COMPOUNDS; SINGLE CRYSTALS; TEMPERATURE PROGRAMMED DESORPTION; THIN FILMS;

ATOMIC LAYER EPITAXY; CADMIUM SULFIDE; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE (NEXAFS); THERMAL DESORPTION SPECTROSCOPY; ZINC SELENIDE;

SEMICONDUCTING FILMS;

EID: 0032027307     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970732d     Document Type: Article

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