Assembly of mesoscale particles over large areas and its application in fabricating tunable optical filters

Langmuir

Volumn 15, Issue 1, 1999, Pages 266-273

  Park, Sang Hyun ^a   Xia, Younan ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLINE MATERIALS; CRYSTALLIZATION; DISPERSIONS; GLASS; MORPHOLOGY; OPTICAL FILTERS; PARTICLES (PARTICULATE MATTER); PHOTORESISTS; POLYSTYRENES; SUBSTRATES; SURFACE PROPERTIES;

CUBIC CLOSE PACKED (CCP) STRUCTURE;

OPTICAL MATERIALS;

EID: 0033524292     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980658e     Document Type: Article

References (62)

1. (a) Kumar, A.; Abbott, N. L.; Kim, E.; Biebuyck, H.; Whitesides, G. M. Acc. Chem. Res. 1995, 28, 219-226.
2. (b) Microspheres Catalog; Polysciences; Inc.: Warrington, PA, 1998.
3. See, for example: Matijevic, E. Langmuir 1994, 10, 8-16.
4. Hayashi, S.; Kumamoto, Y.; Suzuki, T.; Hirai, T. J. Colloid Interface Sci. 1991, 144, 538-547.
5. (a) Roxlo, C. B.; Deckman, H. W.; Gland, J.; Cameron, S. D.; Chianelli, R. R. Science 1987, 235, 1629-1631.
6. (b) Buncick, M. C.; Warmack, R. J.; Ferrell, T. L. J. Opt. Soc. Am. B 1987, 4, 927-933.
7. (c) Lenzmann, F.; Li, K.; Kitai, A. H.; Stöver, H. D. H. Chem. Mater. 1994, 6, 156-159.
8. (d) Burmeister, F.; Schäfle, C.; Matthes, T.; Böhmisch, M. Langmuir 1997, 13, 2983-2987.
9. (e) Boneberg, J.; Burmeister, F.; Schäfle, C.; Leiderer, P.; Reim, D.; Fery, A.; Herminghaus, S. Langmuir 1997, 13, 7080-7084.
10. (f) Padeste, C.; Kossek, S.; Lehmann, H. W.; Musil, C. R.; Gobrecht, J.; Tiefenaur, L. J. Electrochem. Soc. 1997, 143, 3890-3895.
11. Xia, Y.; Tien, J.; Qin, D.; Whitesides, G. M. Langmuir 1996, 12, 4033-4038.
12. (a) Velev, O. D.; Jede, T. A.; Lobo, R. F.; Lenhoff, A. M. Nature 1997, 389, 447-448.
13. (b) Holland, B. T.; Blanford, C. F.; Stein, A. Science 1998, 281, 538-540.
14. (a) Sacks, M. D.; Tseng, T.-Y. J. Am. Ceram. Soc. 1984, 67, 526-532.
15. (b) Calvert, P. Nature 1985, 317, 201.
16. (a) Holtz, J. H.; Asher, S. A. Nature 1997, 389, 829-832.
17. (b) Holtz, J. H.; Holtz, J. S. W.; Munro, C. H.; Asher, S. A. Anal. Chem. 1998, 70, 780-791.
18. Weissman, J. M.; Sunkara, H. B.; Tse, A. S.; Asher, S. A. Science 1996, 274, 959-960.
19. (a) Flaugh, P. L.; O'Donnell, S. E.; Asher, S. A. Appl. Spectrosc. 1984, 38, 847-850.
20. (b) Spry, R. J.; Kosan, D. J. Appl. Spectrosc. 1986, 40, 782-784.
21. Chang, S.-Y.; Liu, L.; Asher, S. A. J. Am. Chem. Soc. 1994, 116, 6739-6744.
22. (a) Tarhan, I. I.; Watson, G. H. Phys. Rev. Lett. 1996, 76, 315-318.
23. (b) Vos, W. L.; Megens, M.; van Tats, C. M.; Bösecke J. Phys. Condens. Mater. 1996, 8, 9503-9507.
24. (c) Miguez, H.; Meseguer, F.; López, C.; Blanco, A.; Moya, J. S.; Requena, J.; Mifsud, A.; Fornés, V. Adv. Mater. 1998, 10, 480-483.
25. Murray, C. A.; Grier, D. G. Am. Sci. 1995, 83, 238-245.
26. Larsen, A. E.; Grier, D. G. Phys. Rev. Lett. 1996, 76, 3862-3865.
27. Skjeltorp, A. T.; Meakin, P. Nature 1988, 335, 424-426.
28. The method based on solvent evaporation: (a) Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Ivanov, I. B.; Yoshimura, H.; Nagayama, K. Langmuir 1992, 8, 3183-3190. (b) Dushkin, C. D.; Nagayama, K.; Miwa, T.; Kralchevsky, P. A. Langmuir 1993, 9, 3695-3701. (c) Lazarov, G. S.; Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Nagayama, K. J. Chem. Soc., Faraday Trans. 1994, 90, 2077-2083. (d) Dimitrov, A. S.; Nagayama, K. Langmuir 1996, 12, 1303-1311. (e) Rakers, S.; Chi, L. F.; Fuchs, H. Langmuir 1997, 13, 7121-7124.
29. The method based on solvent evaporation: (a) Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Ivanov, I. B.; Yoshimura, H.; Nagayama, K. Langmuir 1992, 8, 3183-3190. (b) Dushkin, C. D.; Nagayama, K.; Miwa, T.; Kralchevsky, P. A. Langmuir 1993, 9, 3695-3701. (c) Lazarov, G. S.; Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Nagayama, K. J. Chem. Soc., Faraday Trans. 1994, 90, 2077-2083. (d) Dimitrov, A. S.; Nagayama, K. Langmuir 1996, 12, 1303-1311. (e) Rakers, S.; Chi, L. F.; Fuchs, H. Langmuir 1997, 13, 7121-7124.
30. The method based on solvent evaporation: (a) Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Ivanov, I. B.; Yoshimura, H.; Nagayama, K. Langmuir 1992, 8, 3183-3190. (b) Dushkin, C. D.; Nagayama, K.; Miwa, T.; Kralchevsky, P. A. Langmuir 1993, 9, 3695-3701. (c) Lazarov, G. S.; Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Nagayama, K. J. Chem. Soc., Faraday Trans. 1994, 90, 2077-2083. (d) Dimitrov, A. S.; Nagayama, K. Langmuir 1996, 12, 1303-1311. (e) Rakers, S.; Chi, L. F.; Fuchs, H. Langmuir 1997, 13, 7121-7124.
31. The method based on solvent evaporation: (a) Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Ivanov, I. B.; Yoshimura, H.; Nagayama, K. Langmuir 1992, 8, 3183-3190. (b) Dushkin, C. D.; Nagayama, K.; Miwa, T.; Kralchevsky, P. A. Langmuir 1993, 9, 3695-3701. (c) Lazarov, G. S.; Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Nagayama, K. J. Chem. Soc., Faraday Trans. 1994, 90, 2077-2083. (d) Dimitrov, A. S.; Nagayama, K. Langmuir 1996, 12, 1303-1311. (e) Rakers, S.; Chi, L. F.; Fuchs, H. Langmuir 1997, 13, 7121-7124.
32. The method based on solvent evaporation: (a) Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Ivanov, I. B.; Yoshimura, H.; Nagayama, K. Langmuir 1992, 8, 3183-3190. (b) Dushkin, C. D.; Nagayama, K.; Miwa, T.; Kralchevsky, P. A. Langmuir 1993, 9, 3695-3701. (c) Lazarov, G. S.; Denkov, N. D.; Velev, O. D.; Kralchevsky, P. A.; Nagayama, K. J. Chem. Soc., Faraday Trans. 1994, 90, 2077-2083. (d) Dimitrov, A. S.; Nagayama, K. Langmuir 1996, 12, 1303-1311. (e) Rakers, S.; Chi, L. F.; Fuchs, H. Langmuir 1997, 13, 7121-7124.
33. The method based on Lagmuir film technique: (a) Fulda, K.-U.; Tieke, B. Adv. Mater. 1994, 6, 288-290. (b) Kondo, M.; Shinozaki, K.; Bergström, L.; Mizutani, N. Langmuir 1995, 11, 394-397.
34. The method based on Lagmuir film technique: (a) Fulda, K.-U.; Tieke, B. Adv. Mater. 1994, 6, 288-290. (b) Kondo, M.; Shinozaki, K.; Bergström, L.; Mizutani, N. Langmuir 1995, 11, 394-397.
35. The method based on sedimentation: (a) Mayoral, R.; Requena, J.; Moya, J. S.; López, C.; Cintas, A.; Miguez, H.; Meseguer, F.; Vàzquez, L.; Holgado, M.; Blanco, A. Adv. Mater. 1997, 9, 257-260. (b) Donselaar, L. N.; Philipse, A. P.; Suurmond, J. Langmuir 1997, 13, 6018-6025. (c) Miguez, H.; Meseguer, F.; López, C.; Mifsud, A.; Moya, J. S.; Vàzquez, L. Langmuir 1997, 13, 6009-6011.
36. The method based on sedimentation: (a) Mayoral, R.; Requena, J.; Moya, J. S.; López, C.; Cintas, A.; Miguez, H.; Meseguer, F.; Vàzquez, L.; Holgado, M.; Blanco, A. Adv. Mater. 1997, 9, 257-260. (b) Donselaar, L. N.; Philipse, A. P.; Suurmond, J. Langmuir 1997, 13, 6018-6025. (c) Miguez, H.; Meseguer, F.; López, C.; Mifsud, A.; Moya, J. S.; Vàzquez, L. Langmuir 1997, 13, 6009-6011.
37. The method based on sedimentation: (a) Mayoral, R.; Requena, J.; Moya, J. S.; López, C.; Cintas, A.; Miguez, H.; Meseguer, F.; Vàzquez, L.; Holgado, M.; Blanco, A. Adv. Mater. 1997, 9, 257-260. (b) Donselaar, L. N.; Philipse, A. P.; Suurmond, J. Langmuir 1997, 13, 6018-6025. (c) Miguez, H.; Meseguer, F.; López, C.; Mifsud, A.; Moya, J. S.; Vàzquez, L. Langmuir 1997, 13, 6009-6011.
38. The method based on electrophoretic deposition: (a) Giersig, M.; Mulvaney, P. Langmuir 1993, 9, 3408-3413. (b) Trau, M.; Saville D. A.; Aksay, I. A. Science 1996, 272, 706-709. (c) Yeh, S.-R.; Seul, M.; Shraiman, B.I. Nature 1997, 386, 57-59. (d) Solomentsev, Y.; Böhmer, M.; Anderson, J. L. Langmuir 1997, 13, 6058-6068.
39. The method based on electrophoretic deposition: (a) Giersig, M.; Mulvaney, P. Langmuir 1993, 9, 3408-3413. (b) Trau, M.; Saville D. A.; Aksay, I. A. Science 1996, 272, 706-709. (c) Yeh, S.-R.; Seul, M.; Shraiman, B.I. Nature 1997, 386, 57-59. (d) Solomentsev, Y.; Böhmer, M.; Anderson, J. L. Langmuir 1997, 13, 6058-6068.
40. The method based on electrophoretic deposition: (a) Giersig, M.; Mulvaney, P. Langmuir 1993, 9, 3408-3413. (b) Trau, M.; Saville D. A.; Aksay, I. A. Science 1996, 272, 706-709. (c) Yeh, S.-R.; Seul, M.; Shraiman, B.I. Nature 1997, 386, 57-59. (d) Solomentsev, Y.; Böhmer, M.; Anderson, J. L. Langmuir 1997, 13, 6058-6068.
41. The method based on electrophoretic deposition: (a) Giersig, M.; Mulvaney, P. Langmuir 1993, 9, 3408-3413. (b) Trau, M.; Saville D. A.; Aksay, I. A. Science 1996, 272, 706-709. (c) Yeh, S.-R.; Seul, M.; Shraiman, B.I. Nature 1997, 386, 57-59. (d) Solomentsev, Y.; Böhmer, M.; Anderson, J. L. Langmuir 1997, 13, 6058-6068.
42. The method based on electrostatic interaction: (a) Pieranski, P.; Strzelecki, L.; Pansu, B. Phys. Rev. Lett. 1983, 50, 900-903. (b) Isc, N. Angew. Chem., Int. Ed. Engl. 1986, 25, 323-334. (c) Van Winkle, D. H.; Murray, C. A. Phys. Rev. 1986, 34, 562-573. (d) Sunkara, H. B.; Jethmalani, J. M.; Ford, W. T. Chem. Mater. 1994, 6, 362-364. (e) Larsen, A. E.; Grier, D. G. Nature 1997, 385, 230-233. 26.
43. The method based on electrostatic interaction: (a) Pieranski, P.; Strzelecki, L.; Pansu, B. Phys. Rev. Lett. 1983, 50, 900-903. (b) Isc, N. Angew. Chem., Int. Ed. Engl. 1986, 25, 323-334. (c) Van Winkle, D. H.; Murray, C. A. Phys. Rev. 1986, 34, 562-573. (d) Sunkara, H. B.; Jethmalani, J. M.; Ford, W. T. Chem. Mater. 1994, 6, 362-364. (e) Larsen, A. E.; Grier, D. G. Nature 1997, 385, 230-233. 26.
44. The method based on electrostatic interaction: (a) Pieranski, P.; Strzelecki, L.; Pansu, B. Phys. Rev. Lett. 1983, 50, 900-903. (b) Isc, N. Angew. Chem., Int. Ed. Engl. 1986, 25, 323-334. (c) Van Winkle, D. H.; Murray, C. A. Phys. Rev. 1986, 34, 562-573. (d) Sunkara, H. B.; Jethmalani, J. M.; Ford, W. T. Chem. Mater. 1994, 6, 362-364. (e) Larsen, A. E.; Grier, D. G. Nature 1997, 385, 230-233. 26.
45. The method based on electrostatic interaction: (a) Pieranski, P.; Strzelecki, L.; Pansu, B. Phys. Rev. Lett. 1983, 50, 900-903. (b) Isc, N. Angew. Chem., Int. Ed. Engl. 1986, 25, 323-334. (c) Van Winkle, D. H.; Murray, C. A. Phys. Rev. 1986, 34, 562-573. (d) Sunkara, H. B.; Jethmalani, J. M.; Ford, W. T. Chem. Mater. 1994, 6, 362-364. (e) Larsen, A. E.; Grier, D. G. Nature 1997, 385, 230-233. 26.
46. The method based on electrostatic interaction: (a) Pieranski, P.; Strzelecki, L.; Pansu, B. Phys. Rev. Lett. 1983, 50, 900-903. (b) Isc, N. Angew. Chem., Int. Ed. Engl. 1986, 25, 323-334. (c) Van Winkle, D. H.; Murray, C. A. Phys. Rev. 1986, 34, 562-573. (d) Sunkara, H. B.; Jethmalani, J. M.; Ford, W. T. Chem. Mater. 1994, 6, 362-364. (e) Larsen, A. E.; Grier, D. G. Nature 1997, 385, 230-233. 26.
47. The method based on optical manipulation: Burns, M. M.; Fournier, J.-M.; Golovchenko, J. A. Science 1990, 249, 749-754.
48. Other methods: (a) Kim, E.; Xia, Y.; Whitesides, G. M. Adv. Mater. 1996, 8, 245-247. (b) Neser, S.; Bechinger, C.; Leiderer, P.; Palberg, T. Phys. Rev. Lett. 1997, 79, 2348-2351.
49. Other methods: (a) Kim, E.; Xia, Y.; Whitesides, G. M. Adv. Mater. 1996, 8, 245-247. (b) Neser, S.; Bechinger, C.; Leiderer, P.; Palberg, T. Phys. Rev. Lett. 1997, 79, 2348-2351.
50. Park, S. H.; Qin, D.; Xia, Y. Adv. Mater. 1998, 10 (13), 1028-1032.
51. Chaudhury, M. K.; Whitesides, G. M. Science 1992, 255, 1230-1232.
52. Xia, Y.; Kim, E.; Whitesides, G. M. Chem. Mater. 1996, 8, 1558-1567.
53. Park, S. H.; Xia, Y. Chem. Mater. 1998, 10, 0 (7), 1745-1747.
54. Park, S. H.; Xia, Y. Adv. Mater. 1998, 10 (13), 1045-1048.
55. The thickness (H) of the cell is approximately the same as the thickness of the photoresist film; it can be easily changed from ∼0.5 to ∼100 μm by using different photoresists, different concentrations, and/ or different speeds for spin coating.
56. With some modifications in the present procedure, it is also possible to produce crystalline assemblies of mesoscale particles with more than several hundred layers. For example, we can generate a square cavity (with a flat bottom) in the surface of the bottom substrate with a thickness of ∼200 μm using either dry or wet etching. The number of layers of an assembly of polystyrene beads (<0.48 μm in diameter) in this cavity can reach >500.
57. Dushkin, C. D.; Nagayama, K.; Miwa, T.; Kralchevsky, P. A. Langmuir 1993, 9, 3695-3701.
58. van Blaaderen, A.; Ruel, R.; Wiltzius, P. Nature 1997, 385, 321-324.
59. Tarhan, I. I.; Watson, G. H. Phys. Rev. B 1996, 54, 7593-7597.
60. Hiltner, P. A.; Krieger, I. M. J. Phys. Chem. 1969, 73, 2386-2389.
61. See, for example: (a) Joannopoulos, J. D.; Meade, R. D.; Winn, J. N. Photonic Crystals: Molding the Flow of Light; Princeton University Press: Princeton, NJ, 1995. (b) Wijnhoven, J. E. G. J.; Vos, W. L. Science 1998, 281, 802-804.
62. See, for example: (a) Joannopoulos, J. D.; Meade, R. D.; Winn, J. N. Photonic Crystals: Molding the Flow of Light; Princeton University Press: Princeton, NJ, 1995. (b) Wijnhoven, J. E. G. J.; Vos, W. L. Science 1998, 281, 802-804.