Crystallization of mesoscale particles over large areas

Advanced Materials

Volumn 10, Issue 13, 1998, Pages 1028-1032

  Park, Sang Hyun ^a   Qin, Dong ^b   Xia, Younan ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

^b University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; ENERGY GAP; MONOLAYERS; MULTILAYERS; PARTICLES (PARTICULATE MATTER); SCANNING ELECTRON MICROSCOPY; SENSORS;

PHOTONIC BAND GAP STRUCTURES;

POLYSTYRENES;

EID: 0032162380     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4095(199809)10:13<1028::AID-ADMA1028>3.0.CO;2-P     Document Type: Article

References (47)

1. S. Hayashi, Y. Kumamoto, T. Suzuki, T. Hirai, J. Colloid Interface Sci. 1991, 144, 538.
2. C. B. Roxlo, H. W. Deckman, J. Gland, S. D. Cameron, R. R. Chianelli, Science 1987, 235, 1629. M. C. Buncick, R. J. Warmack, T. L. Ferrell, J. Opt. Soc. Am. B 1987, 4, 927. F. Lenzmann, K. Li, A. H. Kitai, H. D. H. Stöver, Chem. Mater. 1994, 6, 156. F. Burmeister, C. Schäfle, T. Matthes, M. Böhmisch, Langmuir 1997, 13, 2983. J. Boneberg, F. Burmeister, C. Schäfle, P. Leiderer, D. Reim, A. Fery, S. Herminghaus, Langmuir 1997, 13, 7080. C. Padeste, S. Kossek, H. W. Lehmann, C. R. Musil, J. Gobrecht, L. Tiefenaur, J. Electrochem. Soc. 1997, 143, 3890.
3. C. B. Roxlo, H. W. Deckman, J. Gland, S. D. Cameron, R. R. Chianelli, Science 1987, 235, 1629. M. C. Buncick, R. J. Warmack, T. L. Ferrell, J. Opt. Soc. Am. B 1987, 4, 927. F. Lenzmann, K. Li, A. H. Kitai, H. D. H. Stöver, Chem. Mater. 1994, 6, 156. F. Burmeister, C. Schäfle, T. Matthes, M. Böhmisch, Langmuir 1997, 13, 2983. J. Boneberg, F. Burmeister, C. Schäfle, P. Leiderer, D. Reim, A. Fery, S. Herminghaus, Langmuir 1997, 13, 7080. C. Padeste, S. Kossek, H. W. Lehmann, C. R. Musil, J. Gobrecht, L. Tiefenaur, J. Electrochem. Soc. 1997, 143, 3890.
4. C. B. Roxlo, H. W. Deckman, J. Gland, S. D. Cameron, R. R. Chianelli, Science 1987, 235, 1629. M. C. Buncick, R. J. Warmack, T. L. Ferrell, J. Opt. Soc. Am. B 1987, 4, 927. F. Lenzmann, K. Li, A. H. Kitai, H. D. H. Stöver, Chem. Mater. 1994, 6, 156. F. Burmeister, C. Schäfle, T. Matthes, M. Böhmisch, Langmuir 1997, 13, 2983. J. Boneberg, F. Burmeister, C. Schäfle, P. Leiderer, D. Reim, A. Fery, S. Herminghaus, Langmuir 1997, 13, 7080. C. Padeste, S. Kossek, H. W. Lehmann, C. R. Musil, J. Gobrecht, L. Tiefenaur, J. Electrochem. Soc. 1997, 143, 3890.
5. C. B. Roxlo, H. W. Deckman, J. Gland, S. D. Cameron, R. R. Chianelli, Science 1987, 235, 1629. M. C. Buncick, R. J. Warmack, T. L. Ferrell, J. Opt. Soc. Am. B 1987, 4, 927. F. Lenzmann, K. Li, A. H. Kitai, H. D. H. Stöver, Chem. Mater. 1994, 6, 156. F. Burmeister, C. Schäfle, T. Matthes, M. Böhmisch, Langmuir 1997, 13, 2983. J. Boneberg, F. Burmeister, C. Schäfle, P. Leiderer, D. Reim, A. Fery, S. Herminghaus, Langmuir 1997, 13, 7080. C. Padeste, S. Kossek, H. W. Lehmann, C. R. Musil, J. Gobrecht, L. Tiefenaur, J. Electrochem. Soc. 1997, 143, 3890.
6. C. B. Roxlo, H. W. Deckman, J. Gland, S. D. Cameron, R. R. Chianelli, Science 1987, 235, 1629. M. C. Buncick, R. J. Warmack, T. L. Ferrell, J. Opt. Soc. Am. B 1987, 4, 927. F. Lenzmann, K. Li, A. H. Kitai, H. D. H. Stöver, Chem. Mater. 1994, 6, 156. F. Burmeister, C. Schäfle, T. Matthes, M. Böhmisch, Langmuir 1997, 13, 2983. J. Boneberg, F. Burmeister, C. Schäfle, P. Leiderer, D. Reim, A. Fery, S. Herminghaus, Langmuir 1997, 13, 7080. C. Padeste, S. Kossek, H. W. Lehmann, C. R. Musil, J. Gobrecht, L. Tiefenaur, J. Electrochem. Soc. 1997, 143, 3890.
7. C. B. Roxlo, H. W. Deckman, J. Gland, S. D. Cameron, R. R. Chianelli, Science 1987, 235, 1629. M. C. Buncick, R. J. Warmack, T. L. Ferrell, J. Opt. Soc. Am. B 1987, 4, 927. F. Lenzmann, K. Li, A. H. Kitai, H. D. H. Stöver, Chem. Mater. 1994, 6, 156. F. Burmeister, C. Schäfle, T. Matthes, M. Böhmisch, Langmuir 1997, 13, 2983. J. Boneberg, F. Burmeister, C. Schäfle, P. Leiderer, D. Reim, A. Fery, S. Herminghaus, Langmuir 1997, 13, 7080. C. Padeste, S. Kossek, H. W. Lehmann, C. R. Musil, J. Gobrecht, L. Tiefenaur, J. Electrochem. Soc. 1997, 143, 3890.
8. M. D. Sacks, T.-Y. Tseng, J. Am. Ceram. Soc. 1984, 67, 526. P. Calvert, Nature 1985, 317, 201.
9. M. D. Sacks, T.-Y. Tseng, J. Am. Ceram. Soc. 1984, 67, 526. P. Calvert, Nature 1985, 317, 201.
10. O. D. Velev, T. A. Jede, R. F. Lobo, A. M. Lenhoff, Nature 1997, 389, 447.
11. J. H. Holtz, S. A. Asher, Nature 1997, 389, 829.
12. P. L. Flaugh, S. E. O'Donnell, S. A. Asher, Appl. Spectrosc. 1984, 38, 847. S.-Y. Chang, L. Liu, S. A. Asher, J. Am. Chem. Soc. 1994, 116, 6739. J. M. Weissman, H. B. Sunkara, A. S. Tse, S. A. Asher, Science 1996, 274, 959.
13. P. L. Flaugh, S. E. O'Donnell, S. A. Asher, Appl. Spectrosc. 1984, 38, 847. S.-Y. Chang, L. Liu, S. A. Asher, J. Am. Chem. Soc. 1994, 116, 6739. J. M. Weissman, H. B. Sunkara, A. S. Tse, S. A. Asher, Science 1996, 274, 959.
14. P. L. Flaugh, S. E. O'Donnell, S. A. Asher, Appl. Spectrosc. 1984, 38, 847. S.-Y. Chang, L. Liu, S. A. Asher, J. Am. Chem. Soc. 1994, 116, 6739. J. M. Weissman, H. B. Sunkara, A. S. Tse, S. A. Asher, Science 1996, 274, 959.
15. I. I. Tarhan, G. H. Watson, Phys. Rev. Lett. 1996, 76, 315.
16. The method based on solvent evaporation: N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, K. Nagayama, Langmuir 1992, 8, 3183; C. D. Dushkin, K. Nagayama, T. Miwa, P. A. Kralchevsky Langmuir 1993, 9, 3695; G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, K. Nagayama, J. Chem. Soc., Faraday Trans. 1994, 90, 2077; A. S. Dimitrov, K. Nagayama, Langmuir 1996, 12, 1303; S. Rakers, L. F. Chi, H. Fuchs, Langmuir 1997, 13, 7121. The method based on the Langmuir film technique: K.-U. Fulda, B. Tieke, Adv. Mater. 1994, 6, 288; M. Kondo, K. Shinozaki, L. Bergström, N. Mizutani, Langmuir 1995, 11, 394.
17. The method based on solvent evaporation: N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, K. Nagayama, Langmuir 1992, 8, 3183; C. D. Dushkin, K. Nagayama, T. Miwa, P. A. Kralchevsky Langmuir 1993, 9, 3695; G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, K. Nagayama, J. Chem. Soc., Faraday Trans. 1994, 90, 2077; A. S. Dimitrov, K. Nagayama, Langmuir 1996, 12, 1303; S. Rakers, L. F. Chi, H. Fuchs, Langmuir 1997, 13, 7121. The method based on the Langmuir film technique: K.-U. Fulda, B. Tieke, Adv. Mater. 1994, 6, 288; M. Kondo, K. Shinozaki, L. Bergström, N. Mizutani, Langmuir 1995, 11, 394.
18. The method based on solvent evaporation: N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, K. Nagayama, Langmuir 1992, 8, 3183; C. D. Dushkin, K. Nagayama, T. Miwa, P. A. Kralchevsky Langmuir 1993, 9, 3695; G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, K. Nagayama, J. Chem. Soc., Faraday Trans. 1994, 90, 2077; A. S. Dimitrov, K. Nagayama, Langmuir 1996, 12, 1303; S. Rakers, L. F. Chi, H. Fuchs, Langmuir 1997, 13, 7121. The method based on the Langmuir film technique: K.-U. Fulda, B. Tieke, Adv. Mater. 1994, 6, 288; M. Kondo, K. Shinozaki, L. Bergström, N. Mizutani, Langmuir 1995, 11, 394.
19. The method based on solvent evaporation: N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, K. Nagayama, Langmuir 1992, 8, 3183; C. D. Dushkin, K. Nagayama, T. Miwa, P. A. Kralchevsky Langmuir 1993, 9, 3695; G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, K. Nagayama, J. Chem. Soc., Faraday Trans. 1994, 90, 2077; A. S. Dimitrov, K. Nagayama, Langmuir 1996, 12, 1303; S. Rakers, L. F. Chi, H. Fuchs, Langmuir 1997, 13, 7121. The method based on the Langmuir film technique: K.-U. Fulda, B. Tieke, Adv. Mater. 1994, 6, 288; M. Kondo, K. Shinozaki, L. Bergström, N. Mizutani, Langmuir 1995, 11, 394.
20. The method based on solvent evaporation: N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, K. Nagayama, Langmuir 1992, 8, 3183; C. D. Dushkin, K. Nagayama, T. Miwa, P. A. Kralchevsky Langmuir 1993, 9, 3695; G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, K. Nagayama, J. Chem. Soc., Faraday Trans. 1994, 90, 2077; A. S. Dimitrov, K. Nagayama, Langmuir 1996, 12, 1303; S. Rakers, L. F. Chi, H. Fuchs, Langmuir 1997, 13, 7121. The method based on the Langmuir film technique: K.-U. Fulda, B. Tieke, Adv. Mater. 1994, 6, 288; M. Kondo, K. Shinozaki, L. Bergström, N. Mizutani, Langmuir 1995, 11, 394.
21. The method based on solvent evaporation: N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, K. Nagayama, Langmuir 1992, 8, 3183; C. D. Dushkin, K. Nagayama, T. Miwa, P. A. Kralchevsky Langmuir 1993, 9, 3695; G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, K. Nagayama, J. Chem. Soc., Faraday Trans. 1994, 90, 2077; A. S. Dimitrov, K. Nagayama, Langmuir 1996, 12, 1303; S. Rakers, L. F. Chi, H. Fuchs, Langmuir 1997, 13, 7121. The method based on the Langmuir film technique: K.-U. Fulda, B. Tieke, Adv. Mater. 1994, 6, 288; M. Kondo, K. Shinozaki, L. Bergström, N. Mizutani, Langmuir 1995, 11, 394.
22. The method based on solvent evaporation: N. D. Denkov, O. D. Velev, P. A. Kralchevsky, I. B. Ivanov, H. Yoshimura, K. Nagayama, Langmuir 1992, 8, 3183; C. D. Dushkin, K. Nagayama, T. Miwa, P. A. Kralchevsky Langmuir 1993, 9, 3695; G. S. Lazarov, N. D. Denkov, O. D. Velev, P. A. Kralchevsky, K. Nagayama, J. Chem. Soc., Faraday Trans. 1994, 90, 2077; A. S. Dimitrov, K. Nagayama, Langmuir 1996, 12, 1303; S. Rakers, L. F. Chi, H. Fuchs, Langmuir 1997, 13, 7121. The method based on the Langmuir film technique: K.-U. Fulda, B. Tieke, Adv. Mater. 1994, 6, 288; M. Kondo, K. Shinozaki, L. Bergström, N. Mizutani, Langmuir 1995, 11, 394.
23. The method based on sedimentation: R. Mayoral, J. Requena, J. S. Moya, C. López, A. Cintas, H. Miguez, F. Meseguer, L. Vázquez, M. Holgado, A. Blanco, Adv. Mater. 1997, 9, 257; L. N. Donselaar, A. P. Philipse, J. Suurmond, Langmuir 1997, 13, 6018; H. Miguez, F. Meseguer, C. López, A. Mifsud, J. S. Moya, L. Vázquez, Langmuir 1997, 13, 6009.
24. The method based on sedimentation: R. Mayoral, J. Requena, J. S. Moya, C. López, A. Cintas, H. Miguez, F. Meseguer, L. Vázquez, M. Holgado, A. Blanco, Adv. Mater. 1997, 9, 257; L. N. Donselaar, A. P. Philipse, J. Suurmond, Langmuir 1997, 13, 6018; H. Miguez, F. Meseguer, C. López, A. Mifsud, J. S. Moya, L. Vázquez, Langmuir 1997, 13, 6009.
25. The method based on sedimentation: R. Mayoral, J. Requena, J. S. Moya, C. López, A. Cintas, H. Miguez, F. Meseguer, L. Vázquez, M. Holgado, A. Blanco, Adv. Mater. 1997, 9, 257; L. N. Donselaar, A. P. Philipse, J. Suurmond, Langmuir 1997, 13, 6018; H. Miguez, F. Meseguer, C. López, A. Mifsud, J. S. Moya, L. Vázquez, Langmuir 1997, 13, 6009.
26. The method based on electrophoretic deposition: M. Giersig, P. Mulvaney, Langmuir 1993, 9, 3408; M. Trau, D. A. Saville, I. A. Aksay, Science 1996, 272, 706; S.-R. Yeh, M. Seul, B. I. Shraiman, Nature 1997, 386, 57; Y. Solomentsev, M. Böhmer, J. L. Anderson, Langmuir 1997, 13, 6058.
27. The method based on electrophoretic deposition: M. Giersig, P. Mulvaney, Langmuir 1993, 9, 3408; M. Trau, D. A. Saville, I. A. Aksay, Science 1996, 272, 706; S.-R. Yeh, M. Seul, B. I. Shraiman, Nature 1997, 386, 57; Y. Solomentsev, M. Böhmer, J. L. Anderson, Langmuir 1997, 13, 6058.
28. The method based on electrophoretic deposition: M. Giersig, P. Mulvaney, Langmuir 1993, 9, 3408; M. Trau, D. A. Saville, I. A. Aksay, Science 1996, 272, 706; S.-R. Yeh, M. Seul, B. I. Shraiman, Nature 1997, 386, 57; Y. Solomentsev, M. Böhmer, J. L. Anderson, Langmuir 1997, 13, 6058.
29. The method based on electrophoretic deposition: M. Giersig, P. Mulvaney, Langmuir 1993, 9, 3408; M. Trau, D. A. Saville, I. A. Aksay, Science 1996, 272, 706; S.-R. Yeh, M. Seul, B. I. Shraiman, Nature 1997, 386, 57; Y. Solomentsev, M. Böhmer, J. L. Anderson, Langmuir 1997, 13, 6058.
30. The method based on electrostatic interaction: N. Ise, Angew. Chem. Int. Ed. Engl. 1986, 25, 323; H. B. Sunkara, J. M. Jethmalani, W. T. Ford, Chem. Mater. 1994, 6, 362; C. A. Murray, D. G. Grier, Am. Sci. 1995, 83, 238; A. E. Larsen, D. G. Grier, Nature 1997, 385, 230.
31. The method based on electrostatic interaction: N. Ise, Angew. Chem. Int. Ed. Engl. 1986, 25, 323; H. B. Sunkara, J. M. Jethmalani, W. T. Ford, Chem. Mater. 1994, 6, 362; C. A. Murray, D. G. Grier, Am. Sci. 1995, 83, 238; A. E. Larsen, D. G. Grier, Nature 1997, 385, 230.
32. The method based on electrostatic interaction: N. Ise, Angew. Chem. Int. Ed. Engl. 1986, 25, 323; H. B. Sunkara, J. M. Jethmalani, W. T. Ford, Chem. Mater. 1994, 6, 362; C. A. Murray, D. G. Grier, Am. Sci. 1995, 83, 238; A. E. Larsen, D. G. Grier, Nature 1997, 385, 230.
33. The method based on electrostatic interaction: N. Ise, Angew. Chem. Int. Ed. Engl. 1986, 25, 323; H. B. Sunkara, J. M. Jethmalani, W. T. Ford, Chem. Mater. 1994, 6, 362; C. A. Murray, D. G. Grier, Am. Sci. 1995, 83, 238; A. E. Larsen, D. G. Grier, Nature 1997, 385, 230.
34. Other methods: M. M. Burns, J.-M. Fournier, J. A. Golovchenko, Science 1990, 249, 749; E. Kim, Y. Xia, G. M. Whitesides, Adv. Mater. 1996, 8, 245; S. Neser, C. Bechinger, P. Leiderer, T. Palberg, Phys. Rev. Lett. 1997, 79, 2348.
35. Other methods: M. M. Burns, J.-M. Fournier, J. A. Golovchenko, Science 1990, 249, 749; E. Kim, Y. Xia, G. M. Whitesides, Adv. Mater. 1996, 8, 245; S. Neser, C. Bechinger, P. Leiderer, T. Palberg, Phys. Rev. Lett. 1997, 79, 2348.
36. Other methods: M. M. Burns, J.-M. Fournier, J. A. Golovchenko, Science 1990, 249, 749; E. Kim, Y. Xia, G. M. Whitesides, Adv. Mater. 1996, 8, 245; S. Neser, C. Bechinger, P. Leiderer, T. Palberg, Phys. Rev. Lett. 1997, 79, 2348.
37. The methodology described here seems to be a general one for producing crystalline assemblies of mesoscale particles; this procedure can be applied to aqueous dispersions of a wide range of particles regardless of their compositions and surface properties (charge densities and chemical groups). We have successfully applied this method to aqueous dispersions of polystyrene beads with different densities of carboxylic groups on their surfaces, polystyrene beads coated with silver, silica colloids, and polycarbonate beads. S. H. Park, Y. Xia, unpublished.
38. The particles were assembled into the crystalline structure by a mechanism similar to sedimentation. In our case, the particles were concentrated at the bottom of the cell by a hydrodynamic flow of the solvent. The continuous sonication used here provided a kind of "mechanical shaking" that forced the particles to settle down in the most stable thermodynamic state - a close-packed structure.
39. S. H. Park, Y. Xia, Chem. Mater., in press.
40. A. T. Skjeltorp, P. Meakin, Nature 1988, 335, 424.
41. M. K. Chaudhury, G. M. Whitesides, Science 1992, 255, 1230.
42. We also characterized the 25-layer crystals by optical diffraction. The observed positions of the first-order Bragg diffraction peaks could be precisely calculated using a model based on a fcc lattice with the (111) face parallel to the surfaces of the two glass substrates. S. H. Park, Y. Xia, unpublished.
43. The crystalline assemblies made from polystyrene beads as small as ∼150 nm still show iridescent colors in the visible region, but we have not been able to obtain good SEM images from the assemblies made from particles smaller than ∼150 run due to limitations arising from the resolving power of our scanning electron microscope.
44. See, for example, E. Matijevic, Chem. Mater. 1993, 5, 412; N. A. M. Verhaegh, A. van Blaaderen, Langmuir 1994, 10, 1427; C. B. Murray, C. R. Kagan, M. G. Bawendi, Science 1995, 270, 1335.
45. See, for example, E. Matijevic, Chem. Mater. 1993, 5, 412; N. A. M. Verhaegh, A. van Blaaderen, Langmuir 1994, 10, 1427; C. B. Murray, C. R. Kagan, M. G. Bawendi, Science 1995, 270, 1335.
46. See, for example, E. Matijevic, Chem. Mater. 1993, 5, 412; N. A. M. Verhaegh, A. van Blaaderen, Langmuir 1994, 10, 1427; C. B. Murray, C. R. Kagan, M. G. Bawendi, Science 1995, 270, 1335.
47. A. van Blaaderen, R. Ruel, P. Wiltzius, Nature 1997, 385, 321.