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Volumn 273-274, Issue , 1999, Pages 50-53

Effect of Si doping on the strain and defect structure of GaN thin films

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRACK INITIATION; CRACK PROPAGATION; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); RESIDUAL STRESSES; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; STRAIN MEASUREMENT;

EID: 0033348671     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00404-4     Document Type: Article
Times cited : (10)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.