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Volumn 273-274, Issue , 1999, Pages 50-53
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Effect of Si doping on the strain and defect structure of GaN thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPOSITION EFFECTS;
CRACK INITIATION;
CRACK PROPAGATION;
CRYSTAL ORIENTATION;
DISLOCATIONS (CRYSTALS);
RESIDUAL STRESSES;
SEMICONDUCTING FILMS;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
STRAIN MEASUREMENT;
GALLIUM NITRIDE;
THIN FILMS;
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EID: 0033348671
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(99)00404-4 Document Type: Article |
Times cited : (10)
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References (12)
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