Direct determination of lattice distortions by digital processing of HRTEM images of crystals

Ultramicroscopy

Volumn 77, Issue 3-4, 1999, Pages 177-185

  Ade, G ^a   Lauer, R ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Digital processing; Fourier transformation; Lattice distortion; Phase image; Sideband

Indexed keywords

CRYSTAL SYMMETRY; FOURIER TRANSFORMS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE PROCESSING; TRANSMISSION ELECTRON MICROSCOPY;

MANY-BEAM DYNAMICAL THEORY;

CRYSTAL DEFECTS;

ARTICLE; CRYSTAL STRUCTURE; DEFORMITY; FOURIER ANALYSIS; HOLOGRAPHY; IMAGE ANALYSIS; IMAGE PROCESSING; MATHEMATICAL ANALYSIS; STRUCTURE ANALYSIS; THICKNESS;

EID: 0033166776     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00037-6     Document Type: Article

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