Geometric phase analysis of high-resolution electron microscopy images of antiphase domains: Example Cu3Au

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 76, Issue 6, 1997, Pages 1119-1138

  Hytch M J ^a   Potez, L ^b,c  

^a CNRS   (France)

^b ONERA   (France)

^c Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038969659     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619708214218     Document Type: Article

References (23)

1. Bayle, P., Deutsch, T., Gilles, B., Lançon, F., Marty, A., and Thibault, J., 1994, Ullramicroscopy, 56, 94.
2. Bierwolf, R., Hohenstein, H., Phillipp, F., Brandt, O., Crook, G. E., and Ploog, K., 1993, Ultramicroscopy, 49, 273.
3. Bropdin, D., Van Tendeloo, G., Van Landuyt, J., Amelinckx, S., Portier, R., Guymont, M., and Loiseau, A., 1986, Phil. Mag. A, 54, 395.
4. Chevalier, J.-P., and Hÿtch, M. J., 1993, Ultramicroscopy, 52, 415.
5. Chevalier, J.-P., and Stobbs, W. M., 1979, Acta metall., 27, 1197.
6. de Medlenaere, P., van Tendeloo, G., van Landuyt, J., and van Dyck, D., 1995, Ultramicroscopy, 60, 265.
7. de Ruijter, W. J., and Weiss, J. K., 1993, Ultramicroscopy, 50, 269.
8. Fisher, R. M., and Marcinkowski, M. J., 1961, Phil. Mag., 6, 1385.
9. Hÿtch, M. J., 1996, Scanning Microscopy Supplement, Vol. 10, edited by P. Hawkes (Chicago: Scanning Microscopy International) (to be published)
10. Hÿtch, M. J., 1997, Microsc. Microanal. Microstruct., (to be published).
11. Hÿtch, M. J., and Bayle, P., 1994, Proceedings of the 13th International Congress on Electron Microscopy, Vol. 2A (Les Ulis: Les Editions de Physique), p. 129.
12. Hÿtch, M. J., and Chevalier, J.-P., 1993, Ultramicroscopy, 52, 253.
13. Hÿtch, M. J., and Gandais, M., 1995, Phil. Mag. A, 72, 619.
14. Jouneau, P.-H., Tardot, A., Feuillet, B., Mariette, H., and Cibert, J., 1994, J. appl. Phys., 75, 7310.
15. Kikuchi, R., and Cahn, J. W., 1979, Acta metall., 27, 1337.
16. Ourmazd, A., Taylor, D. W., Bode, M., and Kim, Y., 1989, Science, 246, 1571.
17. Planès, J., Loiseau, A., and Ducastelle, F., 1992, J. Phys., Paris, I, 2, 1507.
18. Potez, L., and Loiseau, A., 1994, Interface Sci., 2, 1.
19. Potez, L., Loiseau, A., Azzaoui, M. E., and Pénisson, J.-M., 1997 (to be published).
20. Rahman, S. H., 1993, Acta crystallogr. A, 49, 56.
21. Saxton, W. O., Pitt, T. J., and Horner, M., 1979, Ultramicroscopy, 4, 343.
22. Van Tendeloo, G., and Amelinckx, S., 1974, Phys. Stat. sol. (a), 22, 621.
23. Whelan, M. J., 1970, Modern Diffraction and Imaging Techniques in Materials Science (Amsterdam: North-Holland).