-
4
-
-
0009218889
-
Radiation damage of 50-250 keV hydrogen ions in silicon
-
Chernow F, Borders JA, Brice DK (eds) Plenum Press, New York
-
Chu WK, Kastl RH, Lever RF, Mader S, Masters BJ (1976) Radiation damage of 50-250 keV hydrogen ions in silicon. In: Chernow F, Borders JA, Brice DK (eds) Ion implantation in semiconductors. Plenum Press, New York
-
(1976)
Ion Implantation in Semiconductors
-
-
Chu, W.K.1
Kastl, R.H.2
Lever, R.F.3
Mader, S.4
Masters, B.J.5
-
7
-
-
0030572294
-
-
Di Cioccio L, Letiec Y, Letertre F, Jaussaud C, Bruel M (1996) Electron Lett 32:1144
-
(1996)
Electron Lett
, vol.32
, pp. 1144
-
-
Di Cioccio, L.1
Letiec, Y.2
Letertre, F.3
Jaussaud, C.4
Bruel, M.5
-
8
-
-
0032545852
-
-
Jalaguier E, Aspar B, Pocas S, Michaud JF, Zussy M. Papon AM, Bruel M (1998) Electron Lett 34:408
-
(1998)
Electron Lett
, vol.34
, pp. 408
-
-
Jalaguier, E.1
Aspar, B.2
Pocas, S.3
Michaud, J.F.4
Zussy, M.5
Papon, A.M.6
Bruel, M.7
-
9
-
-
0342727389
-
-
Weldon MK, Marsico VE, Chabal VJ, Agarwal A. Eaglesham DJ. Sapjeta J, Brown W L, Jacobson DC, Caudano Y, Christman SB, Chaban EE (1997) J Vac Sci Technol B 15:1065
-
(1997)
J Vac Sci Technol B
, vol.15
, pp. 1065
-
-
Weldon, M.K.1
Marsico, V.E.2
Chabal, V.J.3
Agarwal, A.4
Eaglesham, D.J.5
Sapjeta, J.6
Brown, W.L.7
Jacobson, D.C.8
Caudano, Y.9
Christman, S.B.10
Chaban, E.E.11
-
10
-
-
0009219681
-
-
Patent FR 2,681,472, (1994) US 5,374,564
-
Bruel M (1993) Patent FR 2,681,472, (1994) US 5,374,564
-
(1993)
-
-
Bruel, M.1
-
11
-
-
0009296444
-
-
Auberton-Hervé AJ, Lamure JM, Barge T, Bruel M, Aspar B, Pelloie JL (1995) Semicond Int 11:97
-
(1995)
Semicond Int
, vol.11
, pp. 97
-
-
Auberton-Hervé, A.J.1
Lamure, J.M.2
Barge, T.3
Bruel, M.4
Aspar, B.5
Pelloie, J.L.6
-
12
-
-
0031150267
-
-
Aspar B, Bruel M, Moriceau H, Maleville C, Poumeyrol T, Papon AM, Claverie A, Benassayag G, Auberton-Hervé AJ, Barge T (1997) Microelectronic Engineering 36:233
-
(1997)
Microelectronic Engineering
, vol.36
, pp. 233
-
-
Aspar, B.1
Bruel, M.2
Moriceau, H.3
Maleville, C.4
Poumeyrol, T.5
Papon, A.M.6
Claverie, A.7
Benassayag, G.8
Auberton-Hervé, A.J.9
Barge, T.10
-
13
-
-
0009147258
-
MRS spring meeting
-
Aspar B, Lagahe C, Moriceau H, Soubie A, Bruel M, Auberton-Hervé AJ, Barge T, Maleville C (1998) MRS Spring Meeting (proceedings to be issued). Symposium: Defects and impurities in semiconductors
-
(1998)
Symposium: Defects and Impurities in Semiconductors
-
-
Aspar, B.1
Lagahe, C.2
Moriceau, H.3
Soubie, A.4
Bruel, M.5
Auberton-Hervé, A.J.6
Barge, T.7
Maleville, C.8
-
18
-
-
0003165705
-
-
Tong QY, Scholz R, Goesele U, Lee TH, Huang LJ, Chao YL, Tan TY (1998) Appl Phys Lett 72:49
-
(1998)
Appl Phys Lett
, vol.72
, pp. 49
-
-
Tong, Q.Y.1
Scholz, R.2
Goesele, U.3
Lee, T.H.4
Huang, L.J.5
Chao, Y.L.6
Tan, T.Y.7
|