Convenient method of X-ray absorption spectroscopy using EPMA

Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan

Volumn 85, Issue 5, 1999, Pages 353-361

  Kawai, Jun ^a   Hayashi, Kouichi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; EMISSION SPECTROSCOPY; FLUORESCENCE; NUMERICAL ANALYSIS; RAMAN SPECTROSCOPY; TRACE ANALYSIS;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; EXTENDED X RAY EMISSION FINE STRUCTURE (EXEFS) SPECTROSCOPY; MICROBEAM ANALYSIS; RADIATIVE AUGER EFFECTS; X RAY ABSORPTION SPECTROSCOPY (XAFS); X RAY FLUORESCENCE;

X RAY SPECTROSCOPY;

EID: 0033121560     PISSN: 00211575     EISSN: None     Source Type: Journal    
DOI: 10.2355/tetsutohagane1955.85.5_353     Document Type: Article

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