ELNES separation in spatially-resolved analysis of grain boundaries and interfaces

Ultramicroscopy

Volumn 76, Issue 4, 1999, Pages 159-172

  Gu, Hui ^a  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

ELNES; Grain boundary; Interface; MSA; Spacial difference; Spectrum imaging

Indexed keywords

CERAMIC MATERIALS; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN BOUNDARIES; SPECTRUM ANALYSIS; STATISTICAL METHODS;

MULTIVARIANT STATISTICAL ANALYSIS (MSA); SPECTRUM IMAGING;

MICROSCOPIC EXAMINATION;

ACCURACY; ARTICLE; ARTIFACT; ARTIFACT REDUCTION; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGING; ULTRASTRUCTURE;

EID: 0033119565     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00083-7     Document Type: Article

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