Quantification of interfacial parameters in spatially resolved analysis involving ELNES separation

Ultramicroscopy

Volumn 76, Issue 4, 1999, Pages 173-185

  Gu, Hui ^a  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Grain boundary; Interface; Interfacial concentration; Interfacial width; Probe size; Spectrum imaging

Indexed keywords

COMPUTATIONAL METHODS; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; SEPARATION; SPECTRUM ANALYSIS;

INTERFACIAL CONCENTRATION; SPATIAL DIFFERENCE TECHNIQUES; SPECTRUM-LINE PROFILING TECHNIQUES;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE QUALITY; IMAGING; PARTICLE SIZE; QUANTITATIVE ASSAY; ULTRASTRUCTURE;

EID: 0033118778     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00003-0     Document Type: Article

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