Fine structure analysis of near-edge electron energy loss spectra related to the compositional variation at the diffuse interfaces in FeGe multilayers

Journal of Applied Physics

Volumn 80, Issue 2, 1996, Pages 853-858

  Suenaga, K ^a   Thorel, A ^a   Houdy, Ph ^b   Colliex, C ^c  

^a PSL RESEARCH UNIVERSITY   (France)

^b UNIVERSITÉ D EVRY VAL D ESSONNE   (France)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041601641     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362894     Document Type: Article

References (27)

1. R. D. Leapman and L. A. Grunes, Phys. Rev. Lett. 45, 397 (1980).
2. J. A. Horsley, J. Chem. Phys. 76, 1451 (1982).
3. A. N. Mansour, J. W. Cook, Jr., and D. E. Sayers, J. Phys. Chem. 88, 2330 (1984).
4. T. K. Sham, Solid State Commun. 64, 3107 (1985).
5. T. I. Morrison, M. B. Brodsky, and N. J. Zaluzec, Phys. Rev. B 32, 3107 (1985).
6. D. H. Pearson, B. Fultz, and C. C. Ahn, Appl. Phys. Lett. 53, 1405 (1988).
7. J. K. Okamoto, D. H. Pearson, C. C. Ahn, and B. Fultz, in Transmission Electron Energy Loss Spectrometry in Materials Science, edited by M. M. Disko, C. C. Ahn, and B. Fultz (TMS. Warrendale, 1992), p. 183.
8. J. L. Mansot, P. Leone, P. Euzen, and P. Palvadeau, Microsc. Microanal. Microstruct. 5, 79 (1994).
9. P. Terzieff, K. Lee, and N. Heiman, J. Appl. Phys. 50, 1031 (1979).
10. O. Massenet, H. Daver, V. D. Nguyen, and J. P. Rebouillat, J. Phys. F 9, 1687 (1979).
11. Y. Cros, J. Appl. Phys. 52, 2196 (1981).
12. K. H. Buschow and P. G van Engen, J. Appl. Phys. 52, 3557 (1981).
13. A. M. van der Kraan and K. H. J. Buschow, Phys. Rev. B 25, 3311 (1982).
14. K. Suenaga, A. Thorel, and Ph. Houdy, Proceedings of the 10th International Colloquium on Plasma Process, Antibes, 1995, p.418.
15. K. Suenaga, A. Thorel, Ph. Houdy, and C. Colliex (unpublished).
16. P. Boher, Ph. Houdy, M. Monkenbusch, J. Penfold, J. Eastoe, and D. J. Smith, Proc. SPIE 1738, 176 (1992).
17. C. Colliex, in Transmission Electron Energy Loss Spectrometry in Materials Science, edited by M. M. Disko, C. C. Ahn, and B. Fultz (TMS, Warrendale, 1992), p. 85.
18. P. Boher et al., Opt. Eng. 30, 1049 (1991).
19. C. Colliex, M. Tencé, E. Lefèvre, C. Mory, H. Gu, D. Bouchet, and C. Jeanguillaume, Mikrochim. Acta 114/115, 71 (1994).
20. R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1986).
21. M. Tencé, M. Quartuccio, and Ch. Colliex, Ultramicroscopy 58, 42 (1995).
22. T. Manoubi, M. Tencé, M. G. Walls, and C. Colliex, Microsc. Microanal. Microstruct. 1, 23 (1990).
23. B. T. Thole and G. van der Laan, Phys. Rev. B 38, 3158 (1988).
24. G. van der Laan and I. W. Kirkman, J. Phys. Condens. Matter 4, 4189 (1992).
25. F. M. F. de Groot, J. Electron Spectr. Relat. Phenom. 67, 529 (1994).
26. R. D. Lorentz, A. Bienenstock, and T. I. Morrison, Phys. Rev. B 49, 3172 (1994).
27. M. J. Regan and A. Bienenstock, Phys. Rev. B 51, 21 170 (1995).