Polarization contrast in reflection near-field optical microscopy with uncoated fibre tips

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 500-506

  Bozhevolnyi, S I ^a   Langbein, W ^a   Hvam, J M ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Contrast mechanisms; Near field optics; Polarization contrast; Resolution; Scanning near field optical microscopy

Indexed keywords

GEOMETRICAL OPTICS; IMAGE RESOLUTION; OPTICAL DATA STORAGE; POLARIZATION; SEMICONDUCTOR QUANTUM WELLS;

CONTRAST MECHANISM; FIBRE TIP; FIELD COMPONENTS; LIGHT WAVELENGTHS; NEAR FIELD OPTICS; NEAR FIELDS; OPTICAL CONTRAST; POLARIZATION CONTRAST; RESOLUTION; SCANNING NEAR-FIELD OPTICAL MICROSCOPY;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ARGON LASER; CONFERENCE PAPER; HELIUM NEON LASER; IMAGE QUALITY; MICROSCOPY; MODEL; OPTICS; POLARIZATION; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0033029193     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00502.x     Document Type: Conference Paper

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