Modeling of {311} defects

Materials Research Society Symposium - Proceedings

Volumn 568, Issue , 1999, Pages 123-134

  Hobler, G ^a   Rafferty, C S ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; DISLOCATIONS (CRYSTALS); STRAIN;

MOMENTS MODEL;

SEMICONDUCTOR DEVICE MODELS;

EID: 0032685523     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-568-123     Document Type: Article

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