Correlation of radiation damage effects in high resistivity silicon detectors with results from deep level spectroscopy

IEEE Transactions on Nuclear Science

Volumn 44, Issue 3 PART 1, 1997, Pages 825-833

  Feick, H ^a   Fretwurst, E ^a   Moll, M ^a   Lindstrom G ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007466407     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.603760     Document Type: Article

References (25)

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