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Volumn 9, Issue 2, 1999, Pages

InP-based micro-opto-electro-mechanical systems (MOEMS)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; HETEROJUNCTIONS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROACTUATORS; MICROMACHINING; MICROSENSORS; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; MONOLITHIC INTEGRATED CIRCUITS; SEMICONDUCTING INDIUM PHOSPHIDE; THREE DIMENSIONAL;

EID: 0032669490     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1999213     Document Type: Article
Times cited : (2)

References (17)
  • 2
    • 0003672023 scopus 로고
    • Artech, London
    • e.g. A. Katz, InP and Related Materials: Processing, Technology and Devices (Artech, London, 1992), C.Y. Chang and F. Kai, GaAs High-Speed Devices (John Wiley & Sons, New York 1994); K.J. Eberling, Integrated Optoelectronics (Springer Verlag, Berlin 1993)
    • (1992) InP and Related Materials: Processing, Technology and Devices
    • Katz, A.1
  • 3
    • 0004129783 scopus 로고
    • John Wiley & Sons, New York
    • e.g. A. Katz, InP and Related Materials: Processing, Technology and Devices (Artech, London, 1992), C.Y. Chang and F. Kai, GaAs High-Speed Devices (John Wiley & Sons, New York 1994); K.J. Eberling, Integrated Optoelectronics (Springer Verlag, Berlin 1993)
    • (1994) GaAs High-speed Devices
    • Chang, C.Y.1    Kai, F.2
  • 4
    • 0004229061 scopus 로고
    • Springer Verlag, Berlin
    • e.g. A. Katz, InP and Related Materials: Processing, Technology and Devices (Artech, London, 1992), C.Y. Chang and F. Kai, GaAs High-Speed Devices (John Wiley & Sons, New York 1994); K.J. Eberling, Integrated Optoelectronics (Springer Verlag, Berlin 1993)
    • (1993) Integrated Optoelectronics
    • Eberling, K.J.1
  • 13
    • 0344440180 scopus 로고    scopus 로고
    • Calculation of III-V semiconductors elastooptical properties : Application to an interferometric stress sensor
    • Postdam, Germany, September 17-19, 1996, H. Reichl and A. Heuberger Eds, VDE-Verlag Gmbh, Berlin
    • G. Fierling, X. Letartre, P. Viktorovitch, C. Lugand, T. Benyattou, J.P. Lainé and F. Sidoroff, «Calculation of III-V semiconductors elastooptical properties : application to an interferometric stress sensor», MICRO SYSTEM Technologies 96, Postdam, Germany, September 17-19, 1996, H. Reichl and A. Heuberger Eds, (VDE-Verlag Gmbh, Berlin, 1996) 817-819.
    • (1996) MICRO SYSTEM Technologies , vol.96 , pp. 817-819
    • Fierling, G.1    Letartre, X.2    Viktorovitch, P.3    Lugand, C.4    Benyattou, T.5    Lainé, J.P.6    Sidoroff, F.7
  • 17
    • 0345303155 scopus 로고    scopus 로고
    • Jerusalem, Israel, February Proceedings to be published
    • P. Gall et al., NFO'4, Jerusalem, Israel, February 1997, Proceedings to be published
    • (1997) NFO'4
    • Gall, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.