How much chemistry is there in chemical force microscopy?

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 6 B, 1999, Pages 3901-3907

  Mckendry, Rachel ^a   Theoclitou, Maria Elena ^a   Abell, Chris ^a   Rayment, Trevor ^a  

^a Department of Chemistry ^*  (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; FRICTION; MONOLAYERS; SURFACE CHEMISTRY;

CHEMICAL FORCE MICROSCOPY (CFM);

ATOMIC FORCE MICROSCOPY;

EID: 0032594510     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.3901     Document Type: Article

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