Sublimation and phase transitions on Si(111) surface observed by ultrahigh vacuum scanning electron microscopy

Surface Review and Letters

Volumn 5, Issue 3-4, 1998, Pages 685-691

  Homma, Yoshikazu ^a,b  

^a NTT CORPORATION   (Japan)

^b NTT Basic Research Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032336679     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x98001043     Document Type: Article

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