Microscopic theory of electromigration on semiconductor surfaces

Physical Review Letters

Volumn 76, Issue 7, 1996, Pages 1114-1117

  Kandel, Daniel ^a   Kaxiras, Efthimios ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3643106041     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.1114     Document Type: Article

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