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Volumn 16, Issue 6, 1998, Pages 3423-3433

Study of thin film deposition processes employing variable kinetic energy, highly collimated neutral molecular beams

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0032328253     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581497     Document Type: Article
Times cited : (24)

References (45)
  • 37
    • 85034288239 scopus 로고    scopus 로고
    • note
    • 30To verify that the use of this plate does not lead to thin film contamination, ex situ analysis was performed on selected films using secondary-ion mass spectrometry SIMS. The content of Mo was found to be below the detection limit in all films examined.
  • 38
    • 0004036391 scopus 로고    scopus 로고
    • edited by I. Prigogine and S. A. Rice Wiley, New York
    • See, e.g., D. Doren, in Advances in Chemical Physics, Volume XCV, edited by I. Prigogine and S. A. Rice (Wiley, New York, 1996).
    • (1996) Advances in Chemical Physics, Volume XCV , vol.95
    • Doren, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.