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Volumn 70, Issue 9, 1997, Pages 1149-1151

Very high (>1019 cm-3) in situ n-type doping of silicon during molecular beam epitaxy using supersonic jets of phosphine

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EID: 1542392649     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119074     Document Type: Article
Times cited : (4)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.