Emitter series resistance from open-collector measurements - Influence of the collector region and the parasitic pnp transistor

IEEE Transactions on Electron Devices

Volumn 45, Issue 12, 1998, Pages 2457-2465

  Gabi, Reinhard ^a   Reisch, Michael ^b  

^a Technologies AG   (Germany)

^b UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

Bipolar transistors; DC measurements; Epitaxial collector; Modeling; Resistance

Indexed keywords

ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; SEMICONDUCTOR DEVICE MODELS;

EMITTER SERIES RESISTANCE;

BIPOLAR TRANSISTORS;

EID: 0032308683     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.735722     Document Type: Article

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