Emitter Effects in Shallow Bipolar Devices: Measurements and Consequences

IEEE Transactions on Electron Devices

Volumn 27, Issue 8, 1980, Pages 1402-1408

  Wieder, Armin W ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - LARGE SCALE INTEGRATION;

TRANSISTORS, BIPOLAR;

EID: 0019045364     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1980.20048     Document Type: Article

References (15)

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