Precise Extraction of Emitter Resistance from an Improved Floating Collector Measurement

IEEE Transactions on Electron Devices

Volumn 42, Issue 2, 1995, Pages 266-273

  Morizuka, Kouhei ^a   Hidaka, Osamu ^a   Mochizuki, Hiroshi ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; GAIN MEASUREMENT; SEMICONDUCTOR DEVICE MODELS;

CONDUCTIVITY MODULATION EFFECT; CURRENT CROWDING; EBERS MOLL MODEL; EMITTER RESISTANCE; FLOATING COLLECTOR MEASUREMENT; GUMMEL PLOT; SATURATION VOLTAGE; THERMAL VOLTAGE; VOLTAGE DROP;

BIPOLAR TRANSISTORS;

EID: 0029248796     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.370070     Document Type: Article

References (6)

1. T. H. Ning and D. D. Tang, “Method for determining the emitter and base series resistances of bipolar transistors,” IEEE Trans. Electron Devices, vol. ED-31, pp. 409–412, 1984.
2. R. C. Taft and J. D. Plummer, “An eight-terminal kelvin-tapped bipolar transistor for extracting parasitic series resistances,” IEEE Trans. Electron Devices, vol. ED-38, pp. 2139–2154, 1991.
3. R. C. M. Wijburg and J. H. Klootwijk, “New method for determining emitter resistance,” Electronics Lett., vol. 28, pp. 733–734, 1992.
4. L. J. Giacoletto, “Measurement of emitter and collector series resis-tances.” IEEE Trans. Electron Devices vol. ED-19. DO. 692–693. 1972.
5. W. Filensky and H. Beneking, “New technique for determination of static emitter and collector series resistances of bipolar transistors,” Electronics Lett ., vol. 17. pp.503–504. 1981.
6. J. R. Hauser, “The effects of distributed base potential on emitter-current injection density and effective base resistance for stripe transistor geometries,” IEEE Trans. Electron Devices, vol. ED-II, pp. 238–242, 1964.