-
1
-
-
1542335215
-
Picosecond photoconductivity: High-speed measurements of devices and materials
-
R. B. Marcuse Ed. San Diego, CA: Academic
-
D. H. Auston, "Picosecond photoconductivity: High-speed measurements of devices and materials," in Semiconductors and Semimetals, R. B. Marcuse. Ed. San Diego, CA: Academic, 1990. vol. 28, pp. 85-130.
-
(1990)
Semiconductors and Semimetals
, vol.28
, pp. 85-130
-
-
Auston, D.H.1
-
2
-
-
21544480098
-
Carrier lifetimes in ion-damaged GaAs
-
M. B. Johnson, T. C. McGill, and N. G. Paulter. "Carrier lifetimes in ion-damaged GaAs," Appl. Phys. Lett., vol. 54, pp. 2424-2426, 1989.
-
(1989)
Appl. Phys. Lett.
, vol.54
, pp. 2424-2426
-
-
Johnson, M.B.1
McGill, T.C.2
Paulter, N.G.3
-
3
-
-
0025534784
-
Femtosecond transient reflectivity measurements as a probe for process-induced defects in silicon
-
A. Esset, W. Kutt, M. Strahnen, G. Maidorn, and H. Kurz, "Femtosecond transient reflectivity measurements as a probe for process-induced defects in silicon," Appl. Surf. Sci., Vol. 46, pp. 446-450, 1990.
-
(1990)
Appl. Surf. Sci.
, vol.46
, pp. 446-450
-
-
Esset, A.1
Kutt, W.2
Strahnen, M.3
Maidorn, G.4
Kurz, H.5
-
4
-
-
0008869280
-
Temperature dependence of the picosecond carrier relaxation in silicon-irradiated silicon-on-sapphire films
-
T. Pfeiffer, J. Kuhl, E. O. Gobel, and L. Palmetshofer, "Temperature dependence of the picosecond carrier relaxation in silicon-irradiated silicon-on-sapphire films," J. Appl. Phys., vol. 62, pp. 1850-1855, 1987.
-
(1987)
J. Appl. Phys.
, vol.62
, pp. 1850-1855
-
-
Pfeiffer, T.1
Kuhl, J.2
Gobel, E.O.3
Palmetshofer, L.4
-
5
-
-
21544439453
-
Carrier lifetime versus ion-implantation dose in silicon on sapphire
-
F. E. Donaey, D. Grischkowsky, and C.-C. Chi, "Carrier lifetime versus ion-implantation dose in silicon on sapphire." Appl. Phys. Lett., vol. 50, pp. 460-462, 1987.
-
(1987)
Appl. Phys. Lett.
, vol.50
, pp. 460-462
-
-
Donaey, F.E.1
Grischkowsky, D.2
Chi, C.-C.3
-
6
-
-
21544439151
-
Picosecond GaAs based photoconductive optoelectronic detectors
-
F. W Smith, H. Q. Le. V. Dradiuk, M. A. Hollis, A. R. Calawa, S. Gupta, M. Frankel, D. R. Dykaar, G. A. Mourou, and T. Y. Hsiang, "Picosecond GaAs based photoconductive optoelectronic detectors," Appl. Phys. Lett., vol. 54, pp. 890-892, 1989
-
(1989)
Appl. Phys. Lett.
, vol.54
, pp. 890-892
-
-
Smith, F.W.1
Le, H.Q.2
Dradiuk, V.3
Hollis, M.A.4
Calawa, A.R.5
Gupta, S.6
Frankel, M.7
Dykaar, D.R.8
Mourou, G.A.9
Hsiang, T.Y.10
-
7
-
-
0001621790
-
Formation of As precipitates in GaAs by ion implantation and thermal annealing
-
A. Claverie, F. Namavar, and Z. Liliental-Weber. "Formation of As precipitates in GaAs by ion implantation and thermal annealing," Appl. Phys. Lett., vol. 62, pp. 1271-1273, 1993.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 1271-1273
-
-
Claverie, A.1
Namavar, F.2
Liliental-Weber, Z.3
-
8
-
-
21544467812
-
Electrical characterization of arsenic-ion-implanted semi-insulating GaAs by current-voltage measurement
-
G.-R. Lin, W.-C. Chen, C.-S. Chang, and C.-L. Pan, "Electrical characterization of arsenic-ion-implanted semi-insulating GaAs by current-voltage measurement." Appl. Phys. Lett., vol. 65, pp. 3272-3274, 1994.
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 3272-3274
-
-
Lin, G.-R.1
Chen, W.-C.2
Chang, C.-S.3
Pan, C.-L.4
-
9
-
-
0001722857
-
Annealing dynamics of arsenic-rich GaAs formed by ion implantation
-
H. Fujioka, J. Krueger, A. Prasad, X. Liu, E. R. Weber, and A. K. Verma, "Annealing dynamics of arsenic-rich GaAs formed by ion implantation," J. Appl. Phys., vol. 78, pp. 1470-1476, 1995.
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 1470-1476
-
-
Fujioka, H.1
Krueger, J.2
Prasad, A.3
Liu, X.4
Weber, E.R.5
Verma, A.K.6
-
10
-
-
0008103802
-
Ultrafast electronics and optoelectronics
-
Washington, DC: Opt. Soc. Amer.
-
H. H. Wang, J. F. Whitaker, H. Fujioka, and Z. Lilienthal-Weber, "Ultrafast electronics and optoelectronics." in OSA Technical Digest Series Washington, DC: Opt. Soc. Amer., 1995, vol. 13, pp. 32-34.
-
(1995)
OSA Technical Digest Series
, vol.13
, pp. 32-34
-
-
Wang, H.H.1
Whitaker, J.F.2
Fujioka, H.3
Lilienthal-Weber, Z.4
-
11
-
-
36449008139
-
Subpicosecond carrier lifetime in arsenic-ion-implanted GaAs
-
F. Ganikhanov, G.-R. Lin, W.-C. Chen, C.-S. Chang, and C.-L. Pan, "Subpicosecond carrier lifetime in arsenic-ion-implanted GaAs," Appl. Phys. Lett., vol. 67, pp. 3465-3467, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 3465-3467
-
-
Ganikhanov, F.1
Lin, G.-R.2
Chen, W.-C.3
Chang, C.-S.4
Pan, C.-L.5
-
12
-
-
0029323727
-
Picosecond carrier lifetime in GaAs implanted with high doses of As ions: An alternative material to low-temperature GaAs for optoelectronic applications
-
A. Krotkus, S. Marcinkevicius, J. Jasinski, M. Kaminska, H. H. Tan, and C. Jagadish, "Picosecond carrier lifetime in GaAs implanted with high doses of As ions: An alternative material to low-temperature GaAs for optoelectronic applications." Appl. Phys. Lett., vol. 66, pp. 3304-3306, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 3304-3306
-
-
Krotkus, A.1
Marcinkevicius, S.2
Jasinski, J.3
Kaminska, M.4
Tan, H.H.5
Jagadish, C.6
-
13
-
-
0001621790
-
Formation of As precipitates in GaAs by ion implantation and thermal annealing
-
A. Claverie, F. Namavar, and Z. Liliental-Weber. "Formation of As precipitates in GaAs by ion implantation and thermal annealing," Appl. Phys. Lett., vol. 62, pp. 1271-1273, 1993.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 1271-1273
-
-
Claverie, A.1
Namavar, F.2
Liliental-Weber, Z.3
-
14
-
-
0000635114
-
Stoichiometry-relaied defects in GaAs grown by molecular-beam epitaxy at low temperatures
-
M. Kaminska, E. R. Weber, Z. Liliental-Weber, R. Leon, and Z. U. Rek. ∑Stoichiometry-relaied defects in GaAs grown by molecular-beam epitaxy at low temperatures." J. Vac. Sci. Technol. B, vol. 4, pp. 710-713, 1989.
-
(1989)
J. Vac. Sci. Technol. B
, vol.4
, pp. 710-713
-
-
Kaminska, M.1
Weber, E.R.2
Liliental-Weber, Z.3
Leon, R.4
Rek, Z.U.5
-
15
-
-
0001580740
-
Anomalous Hall-effect results in low-temperature molecular-beam-epitaxy GaAs: Hopping in a dense EL2-like band
-
D. C. Look, D. C. Walters, M. O. Manasreh, J. R. Sizelove, and C. E. Stutz, "Anomalous Hall-effect results in low-temperature molecular-beam-epitaxy GaAs: Hopping in a dense EL2-like band," Phys. Rev. B, vol. 42, pp. 3578-3581, 1990.
-
(1990)
Phys. Rev. B
, vol.42
, pp. 3578-3581
-
-
Look, D.C.1
Walters, D.C.2
Manasreh, M.O.3
Sizelove, J.R.4
Stutz, C.E.5
-
16
-
-
0030230004
-
Ultrafast response of As-implanted GaAs photoconductors
-
H.-H. Wang, P. Grenier, J. F. Whitaker, H. Fujioka, J. Jasinski, and Z. Liliental-Weber, " Ultrafast response of As-implanted GaAs photoconductors," IEEE J. Select. Topics Quantium Electron., vol. 2, pp. 630-635, 1997.
-
(1997)
IEEE J. Select. Topics Quantium Electron.
, vol.2
, pp. 630-635
-
-
Wang, H.-H.1
Grenier, P.2
Whitaker, J.F.3
Fujioka, H.4
Jasinski, J.5
Liliental-Weber, Z.6
-
17
-
-
0031271743
-
Picosecond responses of low-dosage arsenicion-implanted GaAs phoconductors
-
G.-R. Lin and C.-L. Pan, "Picosecond responses of low-dosage arsenicion-implanted GaAs phoconductors," Appl. Phys. Lett., vol. 71, pp. 2901-2903, 1997.
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 2901-2903
-
-
Lin, G.-R.1
Pan, C.-L.2
-
18
-
-
0000173763
-
Effect of rapid thermal annealing on carrier lifetimes of arsenic-ion-implanted GaAs
-
G.-R. Lin, W.-C. Chen, F. Ganikhanov, C.-S. Chang, and C.-L. Pan, "Effect of rapid thermal annealing on carrier lifetimes of arsenic-ion-implanted GaAs," Appl. Phys. Lett., vol. 69, pp. 996-998, 1996
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 996-998
-
-
Lin, G.-R.1
Chen, W.-C.2
Ganikhanov, F.3
Chang, C.-S.4
Pan, C.-L.5
-
19
-
-
0025534784
-
Ferntosecond transient reflectivity measurements as a probe for process-induced defects in Silicon
-
A. Esser, W. Kutt, M. Strahnen, G.Maidron, and H. Kurz, "Ferntosecond transient reflectivity measurements as a probe for process-induced defects in Silicon," Appl. Surf. Sci., vol. 46, pp. 446-450, 1990.
-
(1990)
Appl. Surf. Sci.
, vol.46
, pp. 446-450
-
-
Esser, A.1
Kutt, W.2
Strahnen, M.3
Maidron, G.4
Kurz, H.5
-
22
-
-
0011079203
-
X-ray rocking curve study of Si-implanted GaAs, Si, and Ge
-
V. S. Speriosu, B. M Paine, M.-A. Nicolet, and H. L. Glass, "X-ray rocking curve study of Si-implanted GaAs, Si, and Ge." Appl. Phys. Lett., vol. 40, pp. 604-606, 1982.
-
(1982)
Appl. Phys. Lett.
, vol.40
, pp. 604-606
-
-
Speriosu, V.S.1
Paine, B.M.2
Nicolet, M.-A.3
Glass, H.L.4
-
23
-
-
0024606671
-
A study of the distribution of hydrogen and strain in proton-bombarded liquid-encapsulated Czochralski-grown GaAs by double-crystal X-ray diffraction and secondary ion mass spectrometry
-
G. T. Brown, S. J. Barnett, S. J. Courtney, and S. S. Gill, "A study of the distribution of hydrogen and strain in proton-bombarded liquid-encapsulated Czochralski-grown GaAs by double-crystal X-ray diffraction and secondary ion mass spectrometry." Mater. Sci Eng. B, Vol. 2, pp. 91-97, 1989.
-
(1989)
Mater. Sci Eng. B
, vol.2
, pp. 91-97
-
-
Brown, G.T.1
Barnett, S.J.2
Courtney, S.J.3
Gill, S.S.4
-
24
-
-
11744352691
-
Double crystal X-ray analysis of strain distribution in rapid thermal annealed. S-implanted GaAs
-
M. Fatemi, P. E. Thompson, J Chaudhuri, and S. Shah. "Double crystal X-ray analysis of strain distribution in rapid thermal annealed. S-implanted GaAs." J. Appl. Phys., vol. 68, pp. 3964-3969, 1990.
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 3964-3969
-
-
Fatemi, M.1
Thompson, P.E.2
Chaudhuri, J.3
Shah, S.4
-
25
-
-
0001722857
-
Annealing dynamics of arsenic-rich GaAs formed by ion-implantation
-
H. Fujioka, J. Krueger, A. Prasad, X. Liu, E. R. Weber, and A. K. Verma, "Annealing dynamics of arsenic-rich GaAs formed by ion-implantation," J. Appl. Phys., vol. 78, pp. 1470-1475, 1995.
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 1470-1475
-
-
Fujioka, H.1
Krueger, J.2
Prasad, A.3
Liu, X.4
Weber, E.R.5
Verma, A.K.6
-
26
-
-
21544438546
-
Structural properties of As-rich GaAS grown by molecular beam epitaxy at low temperatures
-
B. M. Kaminska, Z. Liliental-Weber, E. R Weber, T. George, J. B. Kortright, F. W. Smith, B-Y. Tsaur and A. R. Calawa, "Structural properties of As-rich GaAS grown by molecular beam epitaxy at low temperatures," Appl. Phys. Lett., vol. 54, pp. 1881-1883, 1989.
-
(1989)
Appl. Phys. Lett.
, vol.54
, pp. 1881-1883
-
-
Kaminska, B.M.1
Liliental-Weber, Z.2
Weber, E.R.3
George, T.4
Kortright, J.B.5
Smith, F.W.6
Tsaur, B.-Y.7
Calawa, A.R.8
-
27
-
-
0006980002
-
High-resolution x-ray analysis in low-temperature GaAs
-
M. Fatemi, B. Tadayon, M. E. Twigg, and H. B. Dietrich, "High-resolution x-ray analysis in low-temperature GaAs," Phys. Rev. B. vol. 48, pp. 8911-8917, 1993.
-
(1993)
Phys. Rev. B.
, vol.48
, pp. 8911-8917
-
-
Fatemi, M.1
Tadayon, B.2
Twigg, M.E.3
Dietrich, H.B.4
-
28
-
-
0027866957
-
Anomalies of annealed LT-GaAs samples
-
Z. Liliental-Weber, K. M. Yu, Washburn, and Look, "Anomalies of annealed LT-GaAs samples," J. Electron. Mater., vol. 22, pp. 1395-1399, 1993.
-
(1993)
J. Electron. Mater.
, vol.22
, pp. 1395-1399
-
-
Liliental-Weber, Z.1
Yu, K.M.2
Washburn3
Look4
-
29
-
-
0031552793
-
Ga Vacancies in low-temperature-grown GaAs identified by slow positrons
-
J. Gebauer, R. Krause-Rehberg, S. Eichler, M. Luysberg, H. Sohn, and E. R. Weber, "Ga Vacancies in low-temperature-grown GaAs identified by slow positrons," Appl. Phys. Lett., vol. 71, pp. 638-640, 1997.
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 638-640
-
-
Gebauer, J.1
Krause-Rehberg, R.2
Eichler, S.3
Luysberg, M.4
Sohn, H.5
Weber, E.R.6
-
30
-
-
0008103919
-
Defect density measurements of low temperature grown molecular beam epitaxial GaAs by photothermal deflection spectroscopy
-
M. H. Chan, S. K. So, K. T. Chan, and F. G. Kellert, "Defect density measurements of low temperature grown molecular beam epitaxial GaAs by photothermal deflection spectroscopy," Appl. Phys. Lett., vol. 67, pp. 834-836, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 834-836
-
-
Chan, M.H.1
So, S.K.2
Chan, K.T.3
Kellert, F.G.4
-
31
-
-
0000253975
-
Infrared absorption of deep defects in molecular-beam-epitaxial GaAs layers grown at 200 °C: Observation of an EL2-like defect
-
M. O. Manaresh, D. C. Look, K. R. Evans, and C E Stutz, "Infrared absorption of deep defects in molecular-beam-epitaxial GaAs layers grown at 200 °C: Observation of an EL2-like defect," Phys. Rev. B, vol. 41, pp. 10272-10275, 1990.
-
(1990)
Phys. Rev. B
, vol.41
, pp. 10272-10275
-
-
Manaresh, M.O.1
Look, D.C.2
Evans, K.R.3
Stutz, C.E.4
-
32
-
-
36449004353
-
Native point defects in low-temperature-grown GaAs
-
X. Liu, A. Prasad, S. Nishio, E. R. Weber, Z. Liliental-Weber, and W. Walukiewicz, "Native point defects in low-temperature-grown GaAs," Appl. Phys. Lett., vol. 67, pp. 279-281, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 279-281
-
-
Liu, X.1
Prasad, A.2
Nishio, S.3
Weber, E.R.4
Liliental-Weber, Z.5
Walukiewicz, W.6
-
33
-
-
0037581464
-
Structural, electrical, and optical studies of GaAs implanted with MeV As or Ga Ions
-
J. Jasinski, Z. Liliental-Weber, J. Washburn, H. H. Tan, C. Jagadish, A. Krotkus, S. Marcinkevicius, and M. Kaminska, "Structural, electrical, and optical studies of GaAs implanted with MeV As or Ga Ions," J. Electron. Mater., vol. 26, pp. 449-458, 1997.
-
(1997)
J. Electron. Mater.
, vol.26
, pp. 449-458
-
-
Jasinski, J.1
Liliental-Weber, Z.2
Washburn, J.3
Tan, H.H.4
Jagadish, C.5
Krotkus, A.6
Marcinkevicius, S.7
Kaminska, M.8
-
34
-
-
0026190854
-
Near-infrared transmission measurement of EL2 concentration in semi-insulating GaAs wafer with laser diode (λ = 1.3 μm)
-
C.-L. Pan, H.-H. Wu, and T.-R. Hsieh, "Near-infrared transmission measurement of EL2 concentration in semi-insulating GaAs wafer with laser diode (λ = 1.3 μm)," Jpn. J. Appl Phys., vol. 30, pt. 1, pp. 1430-1432, 1991.
-
(1991)
Jpn. J. Appl Phys.
, vol.30
, Issue.1 PART
, pp. 1430-1432
-
-
Pan, C.-L.1
Wu, H.-H.2
Hsieh, T.-R.3
-
35
-
-
0000259404
-
Effect of thermal annealing on electrical conductivities in arsenic-ion-implanted GaAs
-
W.-C. Chen and C.-S. Chang, "Effect of thermal annealing on electrical conductivities in arsenic-ion-implanted GaAs," Appl. Phys. Lett., vol. 68, pp. 646-648, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 646-648
-
-
Chen, W.-C.1
Chang, C.-S.2
-
36
-
-
36449004810
-
Rapid thermal annealing of low-temperature GaAs layers
-
Z. Liliental-Weber, X. W. Lin, J. Washburn, and W. Schaff, "Rapid thermal annealing of low-temperature GaAs layers," Appl. Phys. Lett., vol. 66, pp. 2086-2088, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 2086-2088
-
-
Liliental-Weber, Z.1
Lin, X.W.2
Washburn, J.3
Schaff, W.4
-
37
-
-
0027866957
-
Anomalies in annealed LT-GaAs samples
-
Z. Liliental-Weber, K. Yu. J. Washburn, and D. C. Look, "Anomalies in annealed LT-GaAs samples," J. Electron. Mater., vol. 22, pp. 1395-1399, 1993.
-
(1993)
J. Electron. Mater.
, vol.22
, pp. 1395-1399
-
-
Liliental-Weber, Z.1
Yu, K.2
Washburn, J.3
Look, D.C.4
-
38
-
-
0030087455
-
The dynamics of thermal annealing in arsenic-ion-implanted semi-insulating GaAs
-
W.-C. Chen, G.-R. Lin, and C.-S. Chang, "The dynamics of thermal annealing in arsenic-ion-implanted semi-insulating GaAs," Jpn. J. Appl. Phys., vol. 35, pt. 2, pp. L192-L194, 1996.
-
(1996)
Jpn. J. Appl. Phys.
, vol.35
, Issue.2 PART
-
-
Chen, W.-C.1
Lin, G.-R.2
Chang, C.-S.3
-
39
-
-
21544472458
-
Arsenic precipitates and the semi-insulating properties of GaAs buffer layers grown by low-temperature molecular beam epitaxy
-
A. C. Warren, J. M. Woodle, J. L. Freeouf, D. Grischkowsky, and M. R. Melloch, "Arsenic precipitates and the semi-insulating properties of GaAs buffer layers grown by low-temperature molecular beam epitaxy," Appl. Phys. Lett., vol. 57, pp. 1331-1333, 1990.
-
(1990)
Appl. Phys. Lett.
, vol.57
, pp. 1331-1333
-
-
Warren, A.C.1
Woodle, J.M.2
Freeouf, J.L.3
Grischkowsky, D.4
Melloch, M.R.5
-
40
-
-
0042805472
-
Synthesis of semi-insulating GaAs by As implantation and thermal annealing: Structural and electrical properties
-
A. Claverie, H. Fujioka, L. Laanab, Z. Liliental-Weber, and E. R. Weber, "Synthesis of semi-insulating GaAs by As implantation and thermal annealing: Structural and electrical properties," Nucl. Instrum. Methods Phys. Res. B, vol. 96, pp. 327-330, 1995.
-
(1995)
Nucl. Instrum. Methods Phys. Res. B
, vol.96
, pp. 327-330
-
-
Claverie, A.1
Fujioka, H.2
Laanab, L.3
Liliental-Weber, Z.4
Weber, E.R.5
-
41
-
-
3743137275
-
Electrical properties in arsenic-ion-implanted GaAs
-
W.-C. Chen and C.-S. Chang, "Electrical properties in arsenic-ion-implanted GaAs," J. Appl. Phys., vol. 80, pp. 1600-1604, 1996.
-
(1996)
J. Appl. Phys.
, vol.80
, pp. 1600-1604
-
-
Chen, W.-C.1
Chang, C.-S.2
-
42
-
-
36449005918
-
+-ion implanted GaAs studied using time-resolved reflectivity
-
+-ion implanted GaAs studied using time-resolved reflectivity," Appl. Phys. Lett., vol. 68, pp. 3287-3289, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 3287-3289
-
-
Janz, S.1
Akano, U.G.2
Mitchell, I.V.3
-
43
-
-
0028513416
-
Large ultrafast nonlinearities in As-rich GaAs
-
S. D. Benjamin, A. Othonos, and P. W. E. Smith, "Large ultrafast nonlinearities in As-rich GaAs," Electron. Lett., vol. 30, pp. 1704-1706, 1994.
-
(1994)
Electron. Lett.
, vol.30
, pp. 1704-1706
-
-
Benjamin, S.D.1
Othonos, A.2
Smith, P.W.E.3
-
44
-
-
0003832103
-
-
Englewood Cliffs, NJ: Prentice-Hall, Prentice Hall Advanced Reference Series
-
S. Wang, Fundamentals of Semiconductor Theory and Device Physics. Englewood Cliffs, NJ: Prentice-Hall, Prentice Hall Advanced Reference Series, 1989, pp. 277-283.
-
(1989)
Fundamentals of Semiconductor Theory and Device Physics
, pp. 277-283
-
-
Wang, S.1
-
45
-
-
0025717369
-
High-voltage picosecond photoconductor switch based on low-temperature-grown GaAs
-
M. Y. Frankel, J. F. Whitaker, G. A. Mourou, F. W. Smith, and A. R. Calawa, "High-voltage picosecond photoconductor switch based on low-temperature-grown GaAs," IEEE Trans. Electron Devices, vol. 37, pp. 2493-2497, 1990.
-
(1990)
IEEE Trans. Electron Devices
, vol.37
, pp. 2493-2497
-
-
Frankel, M.Y.1
Whitaker, J.F.2
Mourou, G.A.3
Smith, F.W.4
Calawa, A.R.5
|