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Volumn E81-C, Issue 4, 1998, Pages 518-522

Improved resistance against the reductive ambient annealing of ferroelectric Pb(Zr, Ti)O3 thin film capacitors with lrO2 top electrode

Author keywords

Catalysis; Hydrogen; Iro2, ferroelectric; PZT

Indexed keywords

ANNEALING; CATALYST ACTIVITY; ELECTRIC RESISTANCE; FERROELECTRIC DEVICES; FERROELECTRICITY; FILM PREPARATION; HYDROGEN; IRIDIUM COMPOUNDS; SEMICONDUCTING LEAD COMPOUNDS; THIN FILM DEVICES;

EID: 0032049946     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (9)
  • 2
    • 0030084512 scopus 로고    scopus 로고
    • 60 ns nonvolatile ferroelectric memory with non-driven plate line write/read scheme," 1996 ISSCC Tech. Digest p. 368, 1996.
    • H. Koike, "A 60 ns nonvolatile ferroelectric memory with non-driven plate line write/read scheme," 1996 ISSCC Tech. Digest p. 368, 1996.
    • "A
    • Koike, H.1
  • 7
    • 0000377815 scopus 로고    scopus 로고
    • 3 (PZT) polarization hysteresis characteristics in Pt/ PZT/Pt ferroelectric thin-film capacitors," Appl. Phys. Lett, vol. 69, p. 3188, 1996.
    • 3 (PZT) polarization hysteresis characteristics in Pt/ PZT/Pt ferroelectric thin-film capacitors," Appl. Phys. Lett, vol. 69, p. 3188, 1996.
    • xTi
    • Kushida-Abdelghafar, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.