Radiation induced charge in sbmox buried oxides: lack of thickness dependence at low applied fields

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2095-2100

  Lawrence, R K ^a   Mrstik, B J ^b   Hughes, H L ^c   McMarr, P J ^a  

^a Advanced Research & Applications Corporation   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c SFA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CHARGE; ELECTRIC CURRENT MEASUREMENT; RADIATION EFFECTS; VOLTAGE MEASUREMENT;

CHARGE TRAPPING; RADIATION INDUCED CHARGES; SEPARATION BY IMPLANTATION OF OXYGEN (SIMOX) WAFERS;

MOS DEVICES;

EID: 0031387254     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659023     Document Type: Article

References (8)

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