The effect of body contact series resistance on soi cmos amplifier stages

IEEE Transactions on Electron Devices

Volumn 44, Issue 12, 1997, Pages 2290-2294

  Edwards, Christopher F ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; OHMIC CONTACTS; SEMICONDUCTOR DEVICE STRUCTURES; SILICON ON INSULATOR TECHNOLOGY;

BODY TIE RESISTANCE; FLOATING BODY EFFECTS;

CMOS INTEGRATED CIRCUITS;

EID: 0031358067     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.644655     Document Type: Article

References (11)

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