메뉴 건너뛰기




Volumn 27, Issue 8, 1992, Pages 1186-1193

A Small-Signal Model for the Frequency-Dependent Drain Admittance in Floating-Substrate MOSFET’s

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS--DESIGN; SEMICONDUCTOR DEVICES, MOSFET; THERMAL EFFECTS;

EID: 0026904737     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.148327     Document Type: Article
Times cited : (37)

References (9)
  • 1
    • 0026046773 scopus 로고
    • A deep-submicrometer microwave digital CMOS/SOS technology
    • Jan.
    • A. E. Schmitz et. al., “A deep-submicrometer microwave digital CMOS/SOS technology,” IEEE Electron Device Lett., vol. 12, pp. 16–17, Jan. 1991.
    • (1991) IEEE Electron Device Lett. , vol.12 , pp. 16-17
    • Schmitz, A.E.1
  • 2
    • 0019396956 scopus 로고
    • Charge pumping in SOS-MOS transistors
    • Jan.
    • N. Sasaki, “Charge pumping in SOS-MOS transistors,” IEEE Trans. Electron Devices, vol. ED-28, pp. 48–52, Jan. 1981.
    • (1981) IEEE Trans. Electron Devices , vol.ED-28 , pp. 48-52
    • Sasaki, N.1
  • 3
    • 0017905144 scopus 로고
    • The effect of a floating substrate on the operation of silicon-on-sapphire transistors
    • Aug.
    • S. S. Eaton and B. Lalevic, “The effect of a floating substrate on the operation of silicon-on-sapphire transistors,” IEEE Trans. Electron Devices, vol. ED-25, pp. 907–912, Aug. 1978.
    • (1978) IEEE Trans. Electron Devices , vol.ED-25 , pp. 907-912
    • Eaton, S.S.1    Lalevic, B.2
  • 5
    • 0026279034 scopus 로고
    • A charge-conserving silicon-on-sapphire SPICE MOSFET model for analogue design
    • (Singapore), June 11–14
    • R. Howes et. al., “A charge-conserving silicon-on-sapphire SPICE MOSFET model for analogue design,” in Proc. IEEE Int. Symp. Circuits Syst. (Singapore), June 11–14, 1991, pp. 2160–2163.
    • (1991) Proc. IEEE Int. Symp. Circuits Syst. , pp. 2160-2163
    • Howes, R.1
  • 6
    • 0021601456 scopus 로고
    • A simple method to characterize substrate current in MOSFET’s
    • Dec.
    • T. Y. Chan, P. K. Ko, and C. Hu, “A simple method to characterize substrate current in MOSFET’s,” IEEE Electron Device Lett., vol. EDL-5, pp. 505–507, Dec. 1984.
    • (1984) IEEE Electron Device Lett. , vol.EDL-5 , pp. 505-507
    • Chan, T.Y.1    Ko, P.K.2    Hu, C.3
  • 7
    • 0025699582 scopus 로고
    • Electrical transient study of negative resistance in SOI MOS transistors
    • Jan.
    • O. Le Neel and M. Haond, “Electrical transient study of negative resistance in SOI MOS transistors,” Electron. Lett., vol. 26, pp. 73–74, Jan. 1990.
    • (1990) Electron. Lett. , vol.26 , pp. 73-74
    • Le Neel, O.1    Haond, M.2
  • 8
    • 0025382934 scopus 로고
    • Modeling of frequency and temperature effects in GaAs MESFET’s
    • Feb.
    • P. C. Canfield, S. C. F. Lam, and D. J. Allshot, “Modeling of frequency and temperature effects in GaAs MESFET’s,” IEEE J. Solid-State Circuits, vol. 25, pp. 299–306, Feb. 1990.
    • (1990) IEEE J. Solid-State Circuits , vol.25 , pp. 299-306
    • Canfield, P.C.1    Lam, S.C.F.2    Allshot, D.J.3
  • 9
    • 0026137501 scopus 로고
    • Estimation of heat transfer in SOI-MOS-FET’s
    • Apr.
    • M. Berger and Z. Chai, “Estimation of heat transfer in SOI-MOS-FET’s,” IEEE Trans. Electron Devices, vol. 38, pp. 871–875, Apr. 1991.
    • (1991) IEEE Trans. Electron Devices , vol.38 , pp. 871-875
    • Berger, M.1    Chai, Z.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.