Analogue design issues for SOI CMOS

IEEE International SOI Conference

Volumn , Issue , 1996, Pages 6-8

  Redman White, W ^a   Tenbroek, B M ^a   Lee, M S L ^a   Edwards, C F ^a   Uren, M J ^a   Bunyan, R J T ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CMOS INTEGRATED CIRCUITS; DIGITAL TO ANALOG CONVERSION; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC CURRENTS; ELECTRIC LOSSES; ELECTRIC RESISTANCE; INTEGRATED CIRCUIT LAYOUT; SEMICONDUCTOR DEVICE MODELS; THERMAL EFFECTS; VLSI CIRCUITS;

BODY NODE EFFECTS; SELF HEATING;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0030399931     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (34)