15-term self-calibration methods for the error-correction of on-wafer measurements

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 5, 1997, Pages 1105-1110

  Heuermann, Holger ^a   Schick, Burkhard ^b  

^a Rosenberger Hochfrequenztechnik ^*  (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Calibration; Leaky errors; Network analyzer; Onwafer measurements; Scattering parameters

Indexed keywords

CALIBRATION; ERROR CORRECTION; MATHEMATICAL MODELS; MEASUREMENT ERRORS;

ON WAFER MEASUREMENTS;

ELECTRIC NETWORK ANALYZERS;

EID: 0031248502     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.676721     Document Type: Article

References (9)

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