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Volumn 64, Issue 6, 1997, Pages 230-237

Opens as postulated calibration standards for measurements on planar structures;Leerläufe als postulierte Kalibrierstandards für Messungen auf planaren Schaltungen

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0345908361     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.