-
1
-
-
0026394514
-
16-Term Error Model and Calibration Procedure for On-Wafer Network Analysis Measurements
-
Butler, J.V., Rytting, D.K., Iskander, M.F., Pollard, R.D. und van den Bossche, M.: 16-Term Error Model and Calibration Procedure for On-Wafer Network Analysis Measurements. IEEE Trans. Microwave Theory Tech., Dez. 1991, S. 2211-2217.
-
(1991)
IEEE Trans. Microwave Theory Tech., Dez.
, pp. 2211-2217
-
-
Butler, J.V.1
Rytting, D.K.2
Iskander, M.F.3
Pollard, R.D.4
Van den Bossche, M.5
-
3
-
-
0018720739
-
Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six Port Automatic Network Analyzer
-
Engen, G.F. und Hoer, C.A.: Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six Port Automatic Network Analyzer, IEEE Trans. Microwave Theory Tech., Dez. 1979, S. 987-993.
-
(1979)
IEEE Trans. Microwave Theory Tech., Dez.
, pp. 987-993
-
-
Engen, G.F.1
Hoer, C.A.2
-
4
-
-
0024177728
-
Thru-Match-Reflect: One Result of a Rigorous Theory for De-embedding and Network Analyzer Calibration
-
Stockholm
-
Eul, H.J. und Schiek, B.: Thru-Match-Reflect: One Result of a Rigorous Theory for De-embedding and Network Analyzer Calibration. 18th European Microwave Conference, Stockholm (1988), S. 909-914.
-
(1988)
18th European Microwave Conference
, pp. 909-914
-
-
Eul, H.J.1
Schiek, B.2
-
5
-
-
0026142480
-
A Generalized Theory and New Calibration Procedures for Network Analyzer Self-Calibration
-
Eul, H.J. und Schiek, B.: A Generalized Theory and New Calibration Procedures for Network Analyzer Self-Calibration, IEEE Trans. Microwave Theory Tech., Apr. 1991, S. 724-731.
-
(1991)
IEEE Trans. Microwave Theory Tech., Apr.
, pp. 724-731
-
-
Eul, H.J.1
Schiek, B.2
-
6
-
-
0002830477
-
A New Procedure for System Calibration and Error Removal in Automatic S-Parameter Measurements
-
Hamburg
-
Franzen, N.R. und Speciale, R.A.: A New Procedure for System Calibration and Error Removal in Automatic S-Parameter Measurements. 5th European Microwave Conference, Hamburg (1975), S. 69-73.
-
(1975)
5th European Microwave Conference
, pp. 69-73
-
-
Franzen, N.R.1
Speciale, R.A.2
-
7
-
-
0347989744
-
-
GGB Industries, Inc.: Picoprobe Model 67 A, Naples, FL 33941, 3/1993
-
GGB Industries, Inc.: Picoprobe Model 67 A, Naples, FL 33941, 3/1993.
-
-
-
-
8
-
-
0028447122
-
Flexible Vector Network Analyzer Calibration with Accuracy Bounds Using an 8-Term or a 16-Term Error Correction Model
-
Jun.
-
Van hamme, H. und Vanden Bossche, M.: Flexible Vector Network Analyzer Calibration with Accuracy Bounds Using an 8-Term or a 16-Term Error Correction Model. IEEE Trans. Instrumentation Measurement. Jun. 1994. S. 976-987.
-
(1994)
IEEE Trans. Instrumentation Measurement
, pp. 976-987
-
-
Van Hamme, H.1
Vanden Bossche, M.2
-
9
-
-
0347989737
-
Neue Kalibrierverfahren für on-Wafer-Messungen
-
Heuermann, H. und Schiek, B.: Neue Kalibrierverfahren für on- wafer-Messungen, Kleinheubacher Berichte Band 37 (1993), S. 195-204.
-
(1993)
Kleinheubacher Berichte
, vol.37
, pp. 195-204
-
-
Heuermann, H.1
Schiek, B.2
-
10
-
-
0027929572
-
Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
-
San Diego
-
-: Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure. IEEE MTT-S Int. Microwave Symposiom, San Diego (1994), S. 1361-1364.
-
(1994)
IEEE MTT-S Int. Microwave Symposiom
, pp. 1361-1364
-
-
-
11
-
-
0347359500
-
Sichere on-wafer-Streuparameter-Messungen mit Selbstkalibrierverfahren
-
-: Sichere on-wafer-Streuparameter-Messungen mit Selbstkalibrierverfahren, Kleinheubacher Berichte Band 38 (1994), S. 611-622.
-
(1994)
Kleinheubacher Berichte
, vol.38
, pp. 611-622
-
-
-
12
-
-
0029292013
-
Error Corrected Impedance Measurements with a Network Analyzer
-
Apr.
-
-: Error Corrected Impedance Measurements with a Network Analyzer. IEEE Trans. Instrumentation Measurement, Apr. 1995, S. 294-299.
-
(1995)
IEEE Trans. Instrumentation Measurement
, pp. 294-299
-
-
-
13
-
-
0346729095
-
Selbstkalibrierverfahren zur Systemfehlerkorrektur von Streuparametermessungen auf Halbleitersubstraten
-
Suttgart
-
Heuermann, H.: Selbstkalibrierverfahren zur Systemfehlerkorrektur von Streuparametermessungen auf Halbleitersubstraten, MIOB'95 Konferenzband, Suttgart (1995), S. 23-29.
-
(1995)
MIOB'95 Konferenzband
, pp. 23-29
-
-
Heuermann, H.1
-
14
-
-
33846403091
-
A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
-
Orlando
-
-: LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements. 45th ARFTG Conference Proc., Orlando (1995), S. 129-136.
-
(1995)
45th ARFTG Conference Proc.
, pp. 129-136
-
-
-
15
-
-
34648876188
-
Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures
-
San Francisco
-
-: Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures. 46th ARFTG Conference Proc., San Francisco (1996), S. 136-145.
-
(1996)
46th ARFTG Conference Proc.
, pp. 136-145
-
-
-
16
-
-
0346729097
-
On-Wafer measurements using the HP 8510 Network Analyzer and Cascade Microtech Wafer Probes
-
Hewlett-Packard GmbH: On-Wafer measurements using the HP 8510 Network Analyzer and Cascade Microtech Wafer Probes, Product Note 8510-6 (1986).
-
(1986)
Product Note
, vol.8510
, Issue.6
-
-
-
17
-
-
0347359502
-
Selbstkalbrierverfahren für Netzwerkanalysatoren mit drei Meßstellen
-
Krekels, H.-G.: Selbstkalbrierverfahren für Netzwerkanalysatoren mit drei Meßstellen. Kleinheubacher Berichte Band 38 (1995), S. 95-104.
-
(1995)
Kleinheubacher Berichte
, vol.38
, pp. 95-104
-
-
Krekels, H.-G.1
-
18
-
-
0017747923
-
A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors
-
Dez.
-
Speciale, R.A.: A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors. IEEE Trans. Microwave Theory Tech., Dez. 1977, S. 1100-1115.
-
(1977)
IEEE Trans. Microwave Theory Tech.
, pp. 1100-1115
-
-
Speciale, R.A.1
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