Flexible Vector Network Analyzer Calibration With Accuracy Bounds Using an 8-Term or a 16-Term Error Correction Model

IEEE Transactions on Microwave Theory and Techniques

Volumn 42, Issue 6, 1994, Pages 976-987

  Bossche, Marc Vanden ^b  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

^b NUANCE COMMUNICATIONS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; LEAST SQUARES APPROXIMATIONS; MICROWAVE DEVICES; NONLINEAR EQUATIONS;

ACCURACY BOUND; ERROR CORRECTION MODEL; FLEXIBLE VECTOR NETWORK ANALYZER;

ELECTRIC NETWORK ANALYZERS;

EID: 0028447122     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.293566     Document Type: Article

References (9)

1. Hewlett-Packard, Student Guide for Basic Network Measurement Using the HP8510A Network Analyzer System, 1986.
2. G. F. Engen and C. A. Hoer, “Thru-reflect-line, an improved technique for calibrating the dual six-port automatic network analyzer" IEEE Trans. Microwave Theory Tech., vol. MTT-27, 987-992, Dec. 1979,.
3. K. J. Silvonen, “A general approach to network calibration,” IEEE Trans. Microwave Theory Tech., vol. 40 pp. 754–759, Apr. 1992.
4. H-J. Eul and B. Schick, “A generalized theory and new calibration procedures for network analyzer self-calibration,” IEEE Trans. Microwave Theory Tech, vol. 39, pp. 724–731, Apr. 1991.
5. J. V. Butler, D. C. Rytting, M. V. Iskander, R. D. Pollard, and M. Vanden Bossche, “16-term error model and calibration procedure for on-wafer network analysis measurements,” IEEE Trans. Microwave Theory Tech., vol. 39, pp. 2211–2217, Dec. 1991.
6. D. Williams, “Deembedding and unterminating microwave fixtures with nonlinear least squares,” IEEE Trans. Microwave Theory Tech., vol. 38, pp. 787–791, June 1990.
7. J. V. Beck and K. J. Arnold, Parameter Estimation in Engineering and Science. New York: Wiley, 1977.
8. H. G. Golub and R. J. Le Veque, “Extensions and uses of the variable projection algorithm for solving nonlinear least squares problems,” Proc. Army Num. Anal. & Comp. Conf, 1979.
9. M. Vanden Bossche, “Measuring nonlinear systems. Part 1: Calibration techniques to measure nonlinear devices,” Ph.D. dissertation, Vrij Universiteit versiteit Brussel, Dept. ELEC, Pleinlaan 2, B-1050 Brussel, Belgium, 1990.