A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors

IEEE Transactions on Microwave Theory and Techniques

Volumn 25, Issue 12, 1977, Pages 1100-1115

  Speciale, Ross A ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS - CALIBRATION; MATHEMATICAL MODELS; MICROWAVES;

LEAKAGE ERRORS; SCATTERING-PARAMETERS; TSD METHOD;

ELECTRIC NETWORKS;

EID: 0017747923     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.1977.1129282     Document Type: Article

References (27)

1. R. A. Hackborn, “An automatic network analyzer system,” Microwave J. vol. 11, pp 45–52, May 1968.
2. B. P. Hand, “Developing accuracy specifications for automatic network analyzer systems,” Hewlett-Packard J., vol. 21, pp. 16–19, Feb. 1970.
3. J. D. Last and S. T. Smith, “Offline correction of microwave network analyser reflection-coefficient errors,” Electron. Lett., vol. 6, p. 641, Oct. 1, 1970.
4. H. V. Shurmer, “New method of calibrating a network analyser,” Electron. Lett., vol. 6, pp. 733–734, Oct. 12, 1970.
5. W. Kruppa and K. F. Sodomski, “An explicit solution for the scattering parameters of a liear two-port measured with an Imperfect test set,” IEEE Trans. Microwave Theory Tech., vol. MTT-19, pp. 122–123. Jan. 1971.
6. H. V. Shurmer, “Low-level programming for for the on-line correction of microwave measurements,” Radio Electron. Eng., vol. 41, pp. 357–364, Aug. 1971.
7. C. T. M. Chang, “Application of Deschamp's graphical method to measurements of the scattering coefficients of multiport waveguide junctions,” IEEE Trans. Microwave Theory Tech., vol. MTT-20, pp. 186–187, Feb. 1972.
8. V. Riech, “Measurement program and calibration standards for microstrip measurements with an automatic network analyzer,” Nachrichtentech. Z, vol. 24, pp. 255–259, May 1971.
9. E. F. DaSilva and M. K. McPhun, “Calibration of microwave network analyser for computer-corrected S-parameter measurements,” Electron. Lett., vol. 9, pp. 126–128, Mar. 22, 1973.
10. H. V. Shurmer, “Calibration procedure for computer-corrected S-parameter characterization of devices mounted in microstrip,” Electron. Lett., vol. 9, pp. 323–324, July 12, 1973.
11. J. W. Gould and G. M. Rhodes, “Computer correction of a microwave network analyser without accurate frequency measurement,” Electron. Lett., vol. 9, pp. 494–495, Oct. 18, 1973.
12. O. I. Davies, R. B. Doshi, and B. Nagenthiram, “Correction of microwave-network-analyser measurements of 2-port devices,” Electron. Lett., vol 9, pp. 543–544, Nov. 15, 1973.
13. S. Rehnmark, “On the calibration process of automatic network analyzer systems,” IEEE Trans. Microwave Theory Tech. vol. MTT-22, pp. 457–458, Apr 1974.
14. I. Kasa, “Exact solution of network analyzer calibration and two-port measurements by sliding terminations,” in Dig. Tech. Papers 1974 Conf. Precision Electromagnetic Measurements, July 1–5, 1974, pp. 90–92.
15. —, “Closed-form mathematical solutions to some network analyzer calibration equations,” IEEE Trans. Instrum Meas. vol. IM-23, pp. 399–402, Dec. 1974.
16. G. F. Engen, “An alternative calibration technique for automated network analyzers with application to adapter evaluation,” in Dig. Tech. Papers 1974 IEEE MTT-S Int. Microwave Symp. (Atlanta, GA), June 12–14, 1974, pp 261–262.
17. —, “Calibration technique for automated network analyzers with application to adapter evaluation,” IEEE Trans. Microwave Theory Tech., vol. MTT-22, pp. 1255–1260, Dec. 1974.
18. D. Woods, “Rigorous derivation of computer corrected network analyser calibration equations,” Electron. Lett., vol 11, pp. 403–404, Aug. 21, 1975.
19. N. R. Franzen and R. A. Speciale, “A new procedure for system calibration and error removal in automated S-parameter measurements,” in Proc. 5th European Microwave Conf. (Hamburg, Germany), Sept. 1–4, 1975, pp. 69–73.
20. V. G. Gelnovatch, “A computer program for the direct calibration of two-port reflectometers for automated microwave measurements,” IEEE Trans. Microwave Theory Tech., vol. MTT-24, pp. 45–47, Jan. 1976.
21. R. A. Speciale, “Automated component testing—It's a reality. Thanks to minicomputers,” Microwave Syst. News, vol. 6, pp. 79–99, June/July 1976.
22. N. R. Franzen and R. A. Speciale, “Accurate scattering parameter measurements on non-connectable microwave networks,” in Proc. 6th European Mtcrowave Conf. (Rome, Italy), Sept. 14–17, 1976, pp. 210–214.
23. —, “Super-TSD. A generalization of the TSD network analyzer calibration procedure, covering n-port measurements with leakage,” in 1977 IEEE-MTT-S Int. Microwave Symp., Dig Tech. Papers (San Diego, CA), June 21–23, 1977, pp. 114–117.
24. R. Bellman, Introduction to Martix Analysis, 2nd ed. New York: McGraw-Hill, 1970, pp. 235–236; also p. 245, problem 16, and p. 92, problem 4.
25. D. C. Youla, “On scattering matrices normalized to complex port numbers,” Proc. IRE, vol. 49. p. 1221, July 1961.
26. K. Kurokawa, “Power waves and the scattering matrix,” IEEE Trans. Microwave Theory Tech., vol. MTT-13, pp. 194–202. Mar. 1965.
27. W. K. Chen, “Relationship between scattering matrix and other matrix representations of linear two-port networks,” Int. J. Electron., vol. 38, pp. 433–441, Apr. 1975.