16-Term Error Model and Calibration Procedure for On-Wafer Network Analysis Measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 39, Issue 12, 1991, Pages 2211-2217

  Bossche, Marc Vanden ^e  

^a UNIVERSITY OF UTAH   (United States)

^b IBM RESEARCH   (United States)

^c HEWLETT PACKARD COMPANY   (United States)

^d UNIVERSITY OF LEEDS   (United Kingdom)

^e Hewlett Packard Belgium SA NV   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS - CALIBRATION; INTEGRATED CIRCUITS, MONOLITHIC - MICROWAVES; MATHEMATICAL TECHNIQUES - ERROR ANALYSIS; MATHEMATICAL TECHNIQUES - LEAST SQUARES APPROXIMATIONS; MEASUREMENT ERRORS;

ERROR CORRECTION MODEL; LEAKY/NONLEAKY SYSTEMS; MMIC WAFER PROBES; ON-WAFER NETWORK ANALYSIS MEASUREMENTS; SINGULAR VALUE DECOMPOSITION; VECTOR NETWORK MEASUREMENTS;

MICROWAVE MEASUREMENTS;

EID: 0026394514     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.106567     Document Type: Article

References (8)

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