Non-isothermal device simulation taking account of transistor self-heating and in-chip thermal interdependence

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

Volumn E80-A, Issue 10, 1997, Pages 1973-1978

  Kawashima, Hirobumi ^a  

^a HOSEI UNIVERSITY   (Japan)

Author keywords

Device simulation; Heat flow; Negative resistance; Non isothermal; Selfheating; Si mosfet

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; HEATING; MATHEMATICAL MODELS; MOSFET DEVICES; NEGATIVE RESISTANCE; THERMAL CONDUCTIVITY OF SOLIDS;

DRAIN CURRENT; DRAIN VOLTAGE; HEAT FLOW EQUATION; THERMAL INTERDEPENDENCE;

INTEGRATED CIRCUIT TESTING;

EID: 0031244980     PISSN: 09168508     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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