Bias Temperature Instability in Hydrogenated Thin-Film Transistors

IEEE Transactions on Electron Devices

Volumn 44, Issue 7, 1997, Pages 1102-1108

  Bhat, Navakanta ^a,b  

^a MOTOROLA INC   (United States)

^b Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MOS DEVICES; THIN FILM DEVICES;

BIAS TEMPERATURE INSTABILITY;

THIN FILM TRANSISTORS;

EID: 0031176928     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.595937     Document Type: Article

References (20)

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