Negative bias stress of MOS devices at high electric fields and degradation of MNOS devices

Journal of Applied Physics

Volumn 48, Issue 5, 1977, Pages 2004-2014

  Jeppson, Kjell O ^a   Svensson, Christer M ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MIS;

EID: 0017493207     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.323909     Document Type: Article

References (24)